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Home > Press > Hitachi Focuses On High-End Microscopy Applications at EMAG 2009

Abstract:
New techniques in SEM, STEM, TEM and FIB will be introduced by Hitachi High-Technologies at EMAG 2009. Dedicated TEM applications development staff and SEM design engineers, in addition to UK applications staff, will be on hand to answer questions and listen to customer ideas regarding the future of electron microscopy.

Hitachi Focuses On High-End Microscopy Applications at EMAG 2009

UK | Posted on July 5th, 2009

The latest advances in atomically resolved imaging and EELS with Cold Field Emission Cs-corrected STEM will be presented during the conference proceedings. The practical considerations of the operation and stability of Cs-corrected instruments will be considered and Hitachi's developments to make atomically resolved data more routinely available will be discussed. The modular HD-2700 STEM platform provides great flexibility for imaging and analysis, available in Cs-corrected and non-corrected configurations as well as with Schottky Emission and Cold Field Emission electron sources.

New In-situ TEM and ground-breaking double-biprism holography data from our 300kV TEM platforms will also be available. Additionally, Hitachi has developed unique methods for tomographic reconstruction - the new Topography Based Reconstruction (TBR) brings new standards of precision compared to conventional WBP and SIRT, and ensure more effective visualization of the three-dimensional structures.

For SEM, the introduction of new, high sensitivity dual in-lens detection systems, coupled with superior low voltage performance from the CFE gun, make the S-5500 and brand-new SU-8000 the pinnacle of high performance SEM. Highly sensitive electron detection at ultra low beam energies and flexible high-contrast transmitted electron imaging (BF/DF/HAADF) make these instruments the ultimate tools for investigating challenging and beam sensitive nanomaterials. The new technologies bridge the gap between SEM, TEM and even traditional surface science techniques, enabling new properties to be investigated.

Also on show will be the extra-ordinarily versatile TM-1000 tabletop microscope. Equipped with 3-D measurement software, EDX elemental analysis and application-specific stages (Heating/Cooling, Tensile/Compression, Nano-manipulators, Tilt / Rotation with IR Chamberscope) the simple-to-use TM-1000 brings flexibility and powerful functionality to a microscopy facility or quality control lab.

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For more information, please click here

Contacts:
Press Enquiries:
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Denis Bulgin
Tel: +44 (0)1763 262621
E-mail:

Other Enquiries: Mike Dixon
Hitachi High-Technologies Corporation
Whitebrook Park
Lower Cookham Road
Maidenhead, Berkshire, SL6 8YA
Tel: + 44 (0) 800 316 1500

Copyright © Hitachi High-Technologies Corporation

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