Nanotechnology Now - Press Release: MikroMasch® Introducing OPUS™ AFM Tips, featuring Tip Visibility

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Abstract:
MikroMasch™ have introduced a new line of AFM tips – OPUS™.

MikroMasch® Introducing OPUS™ AFM Tips, featuring Tip Visibility

Sofia, Bulgaria | Posted on December 9th, 2015

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.

Other important features of OPUS™ AFM probes are:

• Tip sharpness better than 7 nm
• High Q-factor and smooth resonance curves
• A highly competitive pricing

Evaluation samples will be provided free of charge to interested AFM users.

For more information visit www.opustips.com.

To request an evaluation sample please follow this link: www.opustips.com/en/contacts.html

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For more information, please click here

Contacts:
Nikoleta Tsvetkova
MikroMasch™, operated by
Innovative Solutions Bulgaria Ltd.
48, Joliot Curie St.
1113 Sofia
Bulgaria
Tel: +359 2 8658629
Fax: +359 2 9630732

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