Nanotechnology Now - Press Release: TRADE NEWS: Agilent Technologies Introduces New Controller that Significantly Extends Atomic Force Microscopy Capabilities

Home > Press > TRADE NEWS: Agilent Technologies Introduces New Controller that Significantly Extends Atomic Force Microscopy Capabilities

Abstract:
Agilent Technologies Inc. (NYSE:A) today introduced the Magnetic AC Mode III (MAC Mode III) controller, which is particularly useful in areas that require high resolution and force sensitivity, such as biology, polymers and surface science. Built on field-proven technology, this gentle, nondestructive atomic force microscopy (AFM) technique is designed for imaging delicate samples in liquid or air.

TRADE NEWS: Agilent Technologies Introduces New Controller that Significantly Extends Atomic Force Microscopy Capabilities

SANTA CLARA, CA | Posted on May 21st, 2007

"The new set of capabilities provided by MAC Mode III greatly enhances the utility of our nanotechnology measurement instruments, better enabling researchers to customize their experiments," said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Ariz. "The introduction of this technology underscores our commitment to meet and exceed the demands of emerging applications."

MAC Mode III offers three user-configurable lock-in amplifiers, affording researchers versatility, higher accuracy and quicker time to results. It has a wider operating frequency range -- up to 6 MHz -- enabling scientists to investigate higher harmonic modes. Built-in Q control further enhances the resonance peak. Higher harmonic imaging provides contrast beyond that seen with fundamental amplitude and phase signals, allowing scientists to collect additional information about mechanical properties of the sample surface.

The Agilent MAC Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM). Simultaneous, high-accuracy topography and surface potential measurements are facilitated by a servo-on-height cantilever approach that is not susceptible to scanner drift. KFM/EFM offers excellent utility for measuring dielectric films, metal surfaces, piezoelectrics and conductor-insulator transitions.

MAC Mode III can be operated simultaneously with environmental control, temperature control, electrochemical control and controlled fluid exchange. Agilent's acoustic AC mode is included with MAC Mode III.

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About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE:A) is the world’s premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company’s 19,000 employees serve customers in more than 110 countries. Agilent had net revenue of $5.0 billion in fiscal 2006. Information about Agilent is available on the Web at http://www.agilent.com .

AFM Instrumentation from Agilent

Agilent offers high-precision, modular AFM solutions for research, industry and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent’s R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use AFM technologies.

NOTE TO EDITORS: Further technology, corporate citizenship and executive news is available on the Agilent news site at http://www.agilent.com/go/news .

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Contacts:
Agilent Technologies Inc.
Joan Horwitz
+1-480-756-5905

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