Home > News > NIST Explores New Circuitry Shrinking Technology
December 8th, 2006
NIST Explores New Circuitry Shrinking Technology
Abstract:
The bull's-eye solution to the semiconductor industry's hunt for more exact means to measure the relative positions of ever-tinier devices squeezed by the millions onto silicon chips might be new types of targets, and not expensive new equipment, according to modeling studies by the National Institute of Standards and Technology (NIST).
Source:
hpcwire.com
Bookmark:
| Related News Press |
Chip Technology
Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026
Beyond silicon: Electronics at the scale of a single molecule January 30th, 2026
Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025
Announcements
Decoding hydrogen‑bond network of electrolyte for cryogenic durable aqueous zinc‑ion batteries January 30th, 2026
COF scaffold membrane with gate‑lane nanostructure for efficient Li+/Mg2+ separation January 30th, 2026
Human Interest/Art
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Drawing data in nanometer scale September 30th, 2022
Scientists prepare for the world’s smallest race: Nanocar Race II March 18th, 2022
Graphene nanotubes revolutionize touch screen use for prosthetic hands August 3rd, 2021
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||