Nanotechnology Now - Press Release: JEOL Announces New EDXRF for Wide Range of Sample Types

Home > Press > JEOL Announces New EDXRF for Wide Range of Sample Types

Abstract:
JEOL has introduced an easy-to-use, smart solution for high-sensitivity elemental analysis in a new benchtop EDXRF spectrometer. The JSX-1000S ElementEye analyzes major to trace components on most sample types - solids, powders, and liquids - with little or no sample preparation.

JEOL Announces New EDXRF for Wide Range of Sample Types

Peabody, MA | Posted on October 7th, 2014

The ElementEye complements SEM, EPMA, NMR, and mass spectrometry analyses, providing high-sensitivity qualitative and quantitative analysis results in minutes. A Thin Film FP method is optionally available for non-destructive measurement of film thickness on coated samples.

High-sensitivity analysis can be performed across the entire energy range using a maximum of 9 types of filters and a sample chamber vacuum unit. Features of the ElementEye include an optional 12-position auto sample changer; touch screen operation; pre-recorded recipes for standard solution applications - RoHS, Metals (Air/Vacuum*), Oxides (Air/Vacuum*), Organic Materials (Air/Vacuum*) - high-sensitivity SDD and short-path optical system for high throughput analysis; and residual balance and thickness correction for organic samples.

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For more information, please click here

Contacts:
Patricia Corkum

978-536-2273

Pamela J. Mansfield
Marketing Communications
Direct: 978.536.2309

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