Home > Press > New Model Presented to Study Postbuckling Behavior of Nano/Microbeams
Abstract:
Iranian mechanical researchers from Shiraz University studied the effects of heat on postbuckling behavior of nano/microbeams and corrected the inconsistency in the correlations.
They also succeeded in the presentation of analytical and modular respond to investigate the postbuckling behavior of the beams. By presenting analytical respond, simulation costs are decreased and the performance of micro/nanobeams can be demonstrated more precisely.
Numerous theories have so far been proposed to analyze the behaviors of micro/nanostructures. These theories try to predict the actual behavior of the structures by taking into consideration their very small scale. In this research, modified theory of changes in strain has been used for the simulation of nonlinear postbuckling behavior of micro/nanobeams, and the behavior of micro/nanobeam has been investigated as well as accurate simulation.
Results obtained from this research determine the effect of small size of micro/nanostructures on postbuckling forces. Small scale factors change critical force and postbuckling behavior. Results also show that Poisson's Factor should be taken into consideration in modified theory equations for strain changes, and small scale factors change the beginning point of postbuckling behavior. Thermal results show that thermal effects in micro/nanobeams with fixed boundary result in buckling but they change only the axial force in beams with moveable boundaries and they cannot lead to buckling.
The rate and accuracy of the results are increased taking into account the analytical respond presented for this system. Results of the research can be used as a valid reference for comparison purposes. Simulation costs reduced by presenting analytical respond even after the buckling, and the performance of micro/nanobeams can be determined more precisely.
Results of the research have been published in Composite Structures, vol. 106, December 2013, pp. 764-776.
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