Nanotechnology Now - Press Release: Semi-Quantitative Atomic Absorption Measurements

Home > Press > Semi-Quantitative Atomic Absorption Measurements

Abstract:
The ContrAA series of high resolution continuum source atomic absorption spectrophotometers from Analytik Jena UK allow semi-quantitative measurements to be made quickly and easily.

Semi-Quantitative Atomic Absorption Measurements

UK | Posted on March 15th, 2010

The availability of all atomic absorption lines from 190 - 900 nm from a single high intensity continuum radiation source means that sequential analysis for different elements on a single sample can be made extremely rapidly. Since all of the lines are available at the same intensity, semi-quantitative analysis can be made using a multi-element standard solution.

The ContrAA Series of instruments is also ideally suited for identification of interfering samples. Since a 1 nm region of the spectrum is typically examined at high resolution, any interfering lines can be identified by rolling the cursor over them. The instruments' comprehensive library of analytical lines includes many molecular absorption lines as well as the atomic ones, allowing interferences from non metals such as sulphur or halogens to be identified. This is the first time that this has been possible using an AA instrument.

The high resolution ContrAA Series is available in flame and hydride analysis (ContrAA 300) and flame, hydride and graphite furnace analysis (ContrAA 700) versions. The ContrAA is a high-resolution spectrometer that offers better detection limits on all elements by factors between 3 and 7. This versatile range of spectrometers closes the gap between ICP analysis and atomic absorption analysis by combining the robustness and simplicity of the AA approach with the speed and variety of information that is normally associated with ICP.

####

For more information, please click here

Contacts:
Press Enquiries:
In Press PR Ltd , PO Box 24, Royston, Herts, SG8 6TT. Tel: +44 (0)1763 262621

www.inpress.co.uk

Other Enquiries:
Vince Phelan
Analytik Jena UK, PO Box 932, Wembley, HA0 9EH, UK,
Tel: +44 (0)208 429 7466
Fax: +44 (0)208 429 7539
www.analytikjenauk.co.uk

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark: