Home > Press > Tool Order: MultiProbe Ships Six-Head Atomic Force Proper (AFP)
![]() |
Abstract:
Key company purchases Atomic Force Prober (AFP) to help solve FA issues at lower technology nodes. Failure analysts support the choice of the AFP over other tools, given new challenges arising from shrinking technology.
After a thorough evaluation of competitive tools, a major microelectronics company has selected the MultiProbe AFP to help it stay competitive in an industry whose key players are jockeying for the lead in delivering smaller, faster devices.
"I would say that the AFP technique in most cases, is the determinant technique [for identifying root cause], especially regarding lower technologies, below 45nm," says one global competitor.
"The AFP has definitely added a capability that did not exist before. Optical limitations make traditional electrical probing a thing of the past, as features can no longer be resolved; and chamber FIB/SEM probing leads to sample damage and inaccurate results as well as tying up a tool," says another.
The MultiProbe AFP offers both nanoprobing and simultaneous fault isolation imaging in a single tool (topography, current imaging and scanning capacitance).
About MultiProbe™
ISO 9001:2008 certified: MultiProbe™ is the developer and manufacturer of the Atomic Force Prober (AFP), the industry's highest resolution nanoprober. As such, the company is committed to satisfying customer expectations and continually improving technology, processes and customer service. MultiProbe AFPs are installed worldwide, providing electrical measurements of the smallest semiconductor devices, improving yield and accelerating the development of processes as low as 22nm. MultiProbe is located in Santa Barbara, Calif., USA.
Information about MultiProbe is available on the Web at www.multiprobe.com.
####
About MultiProbe
MultiProbe™, is the developer and manufacturer of the Atomic Force nano Prober (AFP): a tool designed for semiconductor failure analysis and R&D and used by companies that manufacture, support or rely on electronics for use in their products.
The AFP is a high-resolution imaging and probing tool that electrically characterizes advanced circuitry: a method of measuring devices and identifying failures that would otherwise be invisible to even the most sophisticated optical microscopes.
Founded in 2001 by Andrew N. Erickson, President and CEO, MultiProbe™, is an ISO 9001:2008 certified company that owes its success to an ongoing commitment to improve technology, processes and customer service. Current clients include leading companies from around the world that strive for faster, smaller technologies to anticipate and fulfill consumer demand.
For more information, please click here
Contacts:
Susie Mauceri
Copyright © MultiProbe
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related News Press |
News and information
Flexible electronics integrated with paper-thin structure for use in space January 17th, 2025
Quantum engineers ‘squeeze’ laser frequency combs to make more sensitive gas sensors January 17th, 2025
Announcements
Quantum engineers ‘squeeze’ laser frequency combs to make more sensitive gas sensors January 17th, 2025
The National Space Society Congratulates SpaceX on Starship’s 7th Test Flight: Latest Test of the Megarocket Hoped to Demonstrate a Number of New Technologies and Systems January 17th, 2025
Tools
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
![]() |
||
![]() |
||
The latest news from around the world, FREE | ||
![]() |
![]() |
||
Premium Products | ||
![]() |
||
Only the news you want to read!
Learn More |
||
![]() |
||
Full-service, expert consulting
Learn More |
||
![]() |