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February 9th, 2006
New Device Revolutionizes Nano Imaging
Abstract:
Georgia Tech researchers have created a highly sensitive atomic force microscopy (AFM) technology capable of high-speed imaging 100 times faster than current AFM. This technology could prove invaluable for many types of nano-research, in particular for measuring microelectronic devices and observing fast biological interactions on the molecular scale, even translating into movies of molecular interactions in real time. The research, funded by the National Science Foundation and the National Institutes of Health, appears in the February issue of Review of Scientific Instruments.
Source:
Georgia Tech
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