Home > Press > NANOSENSORS™ introduces Q30K-Plus Silicon AFM probes
NANOSENSORS™ introduces Q30K-Plus Silicon AFM probes for UHV applications
Neuchâtel, Switzerland | Posted on January 27, 2006
The new NANOSENSORS™ Q30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications was introduced today.
Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800nm).
In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm.
The Q30K-Plus™ AFM probe is available in the following types and package sizes:
PPP-QNCHR-10 for Non-Contact Mode/Tapping Mode™
Typical Values:
- Force Constant = 42 N/m
- Resonance Frequency = 330 kHz
- Cantilever Length = 125 µm
- Cantilever Width = 30 µm
- Quality Factor = 30000
Packages of 10 probes
PPP-QFMR-10 for Force Modulation Mode
Typical Values:
- Force constant = 2.8 N/m
- Resonance frequency = 75 kHz
- Cantilever length = 225 µm
- Cantilever width = 28 µm
- Quality Factor = 30000
Packages of 10 probes
For further information please refer to the NANOSENSORS™ Website at www.nanosensors.com or contact info@nanosensors.com.
Michaela Roessger
info@nanosensors.com
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