Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International



Home > Press > FEI Launches Helios G4 DualBeam Series for Materials Science: The Helios G4 DualBeam Series features new capabilities to enable scientists and engineers to answer the most demanding and challenging scientific questions

Abstract:
FEI (NASDAQ: FEIC) continues to lead the industry with the launch of the Helios™ G4 DualBeam Series for materials science, offering highly automated and precise sample preparation for transmission electron microscopy (TEM) and three-dimensional (3D) sample characterization. The Helios G4 features FEI’s most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technology with a new level of automation and ease-of-use.

FEI Launches Helios G4 DualBeam Series for Materials Science: The Helios G4 DualBeam Series features new capabilities to enable scientists and engineers to answer the most demanding and challenging scientific questions

Hillsboro, OR | Posted on June 27th, 2016

“We are pleased to announce this flagship DualBeam family, which brings a higher level of performance to our materials science customers. The Helios G4 is equipped with new technology to help materials scientists obtain the highest quality subsurface and 3D information at the nanometer scale. The DualBeam’s new guided TEM sample preparation workflow enables even novice users to quickly and easily prepare high-quality, ultra-thin samples for S/TEM imaging,” states Trisha Rice, vice president and general manager of FEI’s Materials Science Business.

The Helios G4 offers many innovative enhancements. Some of the most significant include:

- FEI’s latest and most precise Phoenix FIB column, with industry leading low-voltage performance for ultra-low sample damage,

- FEI’s high-resolution Elstar electron column, with the new UC+ technology that offers 4x more monochromated current than the previous generation,

- Auto Slice & View 4.0 software for unattended FIB nanotomography and a semi-automated workflow for TEM sample preparation, both of which provide high quality results, faster and easier than ever before.

The Helios G4 DualBeam Series also includes the FX model -- a flexible system that delivers dramatic sub-three Ångström STEM resolution. The FX model combines high-resolution imaging and sample preparation on one system, so results can be obtained within minutes of completing the lamella without removing the sample from vacuum, rather than the hours or days required previously to finalize the images on a stand-alone S/TEM system.

“The unique combination of new column technology, software and control electronics helps to support advanced materials characterization,” adds Rice. “The Helios G4 provides essential data to multi-scale, multimodal workflows, giving scientists the ability to locate and obtain information quickly and easily. These novel product enhancements continue to differentiate FEI’s flagship DualBeam Series from all other FIB/SEM solutions on the market.”
For more information about FEI’s Helios G4 DualBeam Series, please visit www.fei.com/products/dualbeam/helios-nanolab/.

####

About FEI Company
FEI Company (Nasdaq: FEIC) designs, manufactures and supports a broad range of high-performance microscopy workflow solutions that provide images and answers at the micro-, nano- and picometer scales. Its innovation and leadership enable customers in industry and science to increase productivity and make breakthrough discoveries. Headquartered in Hillsboro, Ore., USA, FEI has over 2,800 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Helios G4 DualBeam Series. Factors that could affect these forward-looking statements include but are not limited to our ability to manufacture, ship, deliver and install the tools, solutions or software as expected; failure of the product or technology to perform as expected; unexpected technology problems and challenges; changes to the technology; the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results; and the inability of the customer to deploy the tools or develop and deploy the expected new applications. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Sandy Fewkes (media contact)
MindWrite Communications, Inc.
+1 408 224 4024


FEI
Jason Willey (investors and analysts)
Sr. Director, Investor Relations & Corporate Development
+1 503 726 2533

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Researchers develop artificial building blocks of life March 8th, 2024

How surface roughness influences the adhesion of soft materials: Research team discovers universal mechanism that leads to adhesion hysteresis in soft materials March 8th, 2024

Two-dimensional bimetallic selenium-containing metal-organic frameworks and their calcinated derivatives as electrocatalysts for overall water splitting March 8th, 2024

Curcumin nanoemulsion is tested for treatment of intestinal inflammation: A formulation developed by Brazilian researchers proved effective in tests involving mice March 8th, 2024

Imaging

Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024

First direct imaging of small noble gas clusters at room temperature: Novel opportunities in quantum technology and condensed matter physics opened by noble gas atoms confined between graphene layers January 12th, 2024

The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023

Observation of left and right at nanoscale with optical force October 6th, 2023

Software

Visualizing nanoscale structures in real time: Open-source software enables researchers to see materials in 3D while they're still on the electron microscope August 19th, 2022

Luisier wins SNSF Advanced Grant to develop simulation tools for nanoscale devices July 8th, 2022

CEA and Spectronite Develop Software Radio For Spectrally Efficient Backhaul Solutions: Adapted for Spectronite’s X-Series Modem for 5G Systems, the Technology Enables Carrier Aggregation that Provides Radio Links with 10Gb/s Capacity March 4th, 2022

Oxford Instruments’ Atomfab® system is production-qualified at a market-leading GaN power electronics device manufacturer December 17th, 2021

Announcements

What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024

Curcumin nanoemulsion is tested for treatment of intestinal inflammation: A formulation developed by Brazilian researchers proved effective in tests involving mice March 8th, 2024

The Access to Advanced Health Institute receives up to $12.7 million to develop novel nanoalum adjuvant formulation for better protection against tuberculosis and pandemic influenza March 8th, 2024

Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024

Tools

First direct imaging of small noble gas clusters at room temperature: Novel opportunities in quantum technology and condensed matter physics opened by noble gas atoms confined between graphene layers January 12th, 2024

New laser setup probes metamaterial structures with ultrafast pulses: The technique could speed up the development of acoustic lenses, impact-resistant films, and other futuristic materials November 17th, 2023

Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023

The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project