Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Hitachi's advanced HT7700 120kV TEM becomes more powerful!

Abstract:
The introduction of the new objective lens option and a new STEM version makes Hitachi's HT7700 the most powerful 120 kV TEM currently available, as well as the most intuitive. Now the ground-breaking HT7700 is just as well suited to the low accelerating voltage, high resolution examination of engineered light element materials as the advanced biomedical and biological samples for which it is already known.

Hitachi's advanced HT7700 120kV TEM becomes more powerful!

Royston, UK | Posted on October 2nd, 2012

The new high resolution pole piece option for the HT7700 utilises Hitachi's unique double-gap objective lens technology, together with minimised spherical aberration to provide enhanced resolution - the best in class for a 120 kV instrument. This makes it especially suited to high resolution imaging of light element materials where lower voltages provide improved contrast and reduced damage. Exceptional imaging is possible even at voltages as low as 40 kV.

The HT7700 continues to offer fully digital imaging, with a wide range of fully integrated and semi integrated CCD camera systems to ensure that the best camera is available for the application. A high sensitivity real-time digital CCD camera enables all microscope operations to be performed through the graphical user interface - including setup, alignment, image adjustment and image acquisition.

An optional high performance Scanning Transmission Electron Microscope (STEM) system further enhances the analytical capabilities of the HT7700. This integrates seamlessly with HT7700 operation and provides powerful brightfield and darkfield imaging. The high magnification and large Field-Of-View STEM is ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis. With an intuitive STEM GUI and automation capabilities, spatially resolved EDX, analytical imaging and thick section analysis are all made routine. All STEM images are instantly archived in Hitachi's EMIP database software.

####

For more information, please click here

Contacts:
Press Enquiries:
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Tel: +44 1763 262621

www.inpress.co.uk

Other Enquiries:

Copyright © Hitachi High-Technologies

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Multi-million pound project to use nanotechnology to improve safety September 4th, 2015

Magnetic wormhole connecting 2 regions of space created for the first time: The device could have applications in medicine, opening up ways to make MRIs more comfortable for patients September 4th, 2015

Tongfang Global and QD Vision Partner to Bring Wide Color Gamut to Global Television Lines: Color IQTM quantum dots help boost company’s focus on superior color reproduction September 3rd, 2015

QEOS and GLOBALFOUNDRIES to Offer Industry’s First CMOS Platform for MillimeterWave Markets: GLOBALSOLUTIONSSM Partnership will enable next-generation wireless technologies for applications in IoT, 5G and automotive September 3rd, 2015

Imaging

JEOL Introduces New Best-in-Class Field Emission SEM September 2nd, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

Software

High Precision, High Stability XYZ Microscope Stages, with Capacitive Feedback August 18th, 2015

Setting ground rules for nanotechnology research: Two new projects set the stage for nanotechnology research to move into Big Data August 18th, 2015

AIS Introduces Industry 4.0 Ready, Industrial Controls and Factory Automation HMI Touch-Panels, for Easy Visual, Control and Monitoring in Discrete and Process Automation Industries June 15th, 2015

New JEOL E-Beam Lithography System to Enhance Quantum NanoFab Capabilities May 6th, 2015

Announcements

Multi-million pound project to use nanotechnology to improve safety September 4th, 2015

Magnetic wormhole connecting 2 regions of space created for the first time: The device could have applications in medicine, opening up ways to make MRIs more comfortable for patients September 4th, 2015

Making nanowires from protein and DNA September 3rd, 2015

Making fuel from light: Argonne research sheds light on photosynthesis and creation of solar fuel September 3rd, 2015

Tools

Oxford Instruments’ Triton Cryofree dilution refrigerator selected by Oxford University for developing scalable quantum nanodevices September 2nd, 2015

JEOL Introduces New Best-in-Class Field Emission SEM September 2nd, 2015

Atomic Force Microscopes from Asylum Research Guide the Development of Thin Film Deposition and Etch Processes September 2nd, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic