Home > Press > Veeco Introduces HarmoniX: New Quantitative AFM Mode for High-Resolution Material Mapping
HarmoniX: Powerful new AFM technique for high-resolution nanoscale imaging and analysis (Photo: Business Wire) |
Abstract:
Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, today introduced HarmoniXTM, a powerful new atomic force microscope (AFM) technique for high-resolution nanoscale imaging and analysis. Veeco's HarmoniX Nanoscale Material Property Mapping enables AFM users to simultaneously, and in real-time, acquire high-resolution images as well as high-resolution, quantitative material property maps. The HarmoniX mode is now available on all Veeco scanning probe microscopes that are powered by the new NanoScope® V controller, including the MultiMode® V, DimensionTM V, and BioScopeTM II.
David Rossi, Vice President, General Manager of Veeco's Nano-Bio AFM Business, commented, "HarmoniX is a significant breakthrough in SPM technology and opens the door to quantitative material property characterization at speeds and levels of resolution previously impossible. Our product scientists and engineering team collaborated with Dr. Ozgur Sahin, of the Rowland Institute at Harvard, to develop and bring this new patented technique to market. Thousands of publications have referenced Veeco's AFMs, and we believe that HarmoniX, available exclusively from Veeco, represents a major leap forward to enable our customers' further scientific discoveries."
Dr. Bede Pittenger, Veeco Development Scientist, added, "HarmoniX provides an AFM user the ability to simultaneously capture quantitative maps of material properties, such as elasticity, adhesion, dissipation and peak force. The HarmoniX technique renders these maps at speeds that are orders of magnitude greater than currently-available force techniques, with the same level of high resolution our customers are accustomed to with Veeco's TappingModeTM."
About HarmoniX
Veeco's NanoScope V microscope controller and proprietary probes provide the speed, signal levels, and processing power necessary to render high-resolution data never before seen in real time. HarmoniX acquires real-time force curves by measuring the cantilever's torsional and flexural motion each time the AFM tip interacts with the surface in TappingMode. Proprietary algorithms instantly calculate the force curves that occur when the tip taps the surface, and analyze them to obtain multiple sample characteristics. These material properties are then rendered in image maps that correlate to the sample topography image. These maps are quantitative and directly traceable to the Elastic Modulus of the sample being imaged. To learn more about HarmoniX, and to see a video of how it works, please visit www.veeco.com/harmonix-pr.
####
About Veeco Instruments Inc.
Veeco Instruments Inc. manufactures enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco’s manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the U.S., Europe, Japan and APAC.
To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2007 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.
For more information, please click here
Contacts:
Metrology Marketing Communications
Karen Gertz
805-967-2700 x2412
Copyright © Business Wire 2008
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related News Press |
News and information
Simulating magnetization in a Heisenberg quantum spin chain April 5th, 2024
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Imaging
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
Observation of left and right at nanoscale with optical force October 6th, 2023
Videos/Movies
New X-ray imaging technique to study the transient phases of quantum materials December 29th, 2022
Solvent study solves solar cell durability puzzle: Rice-led project could make perovskite cells ready for prime time September 23rd, 2022
Scientists prepare for the world’s smallest race: Nanocar Race II March 18th, 2022
Visualizing the invisible: New fluorescent DNA label reveals nanoscopic cancer features March 4th, 2022
Announcements
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||