Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > FEI and Malvern Release Advanced Particle Characterization System

Abstract:
Quanta Morphologi Delivers Direct Method Data for Critical Pharmaceutical Applications

FEI and Malvern Release Advanced Particle Characterization System

PORTLAND, OR | Posted on March 3rd, 2008

FEI Company (NASDAQ: FEIC) and Malvern Instruments Ltd. (Malvern, UK) have released Quanta Morphologi, a powerful new solution combining the performance of FEI's Quanta FEG scanning electron microscope and Malvern's proven Morphologi particle characterization software. For the first time ever, Quanta Morphologi users, including pharmaceutical quality control method development labs, will have direct analysis methods to obtain both size and shape information on sub-micron particles.

This powerful solution will provide pharmaceutical companies greater control over new products and drug formulations that require particle manufacture at increasingly smaller nanoscale dimensions for a wide variety of advanced therapeutic applications.

"In pharmaceutical manufacturing, quality assurance and control laboratories must ensure that quality standards are constantly met for raw materials, intermediates and final products," explained Matt Harris, vice president of FEI's NanoBiology division. "Particle size and shape can dramatically alter the physical and therapeutic properties of active pharmaceutical ingredients. Until now, there have been no direct methods to characterize sub-micron particles. Combining the magnification and resolving power of the Quanta scanning electron microscope (SEM) with Malvern Instruments' industry-leading software provides a critical turnkey solution."

With Quanta Morphologi, users will be able to create reference methods for quality control process design, perform automated particle analysis, obtain surface detail, and perform statistical analysis to more fully characterize particle size and shape distributions. The most important morphological parameters for differentiating a set of samples, such as good and bad sample batches, can be defined and subtle changes in a product or process can be readily identified.

"In today's pharmaceutical industry the ‘nanonization' of poorly soluble active pharmaceutical ingredients is one of the current strategies for developing new, more potent drugs," explains Arjen Tinke, principal scientist for particle characterization at Johnson & Johnson pharmaceutical research and development in Europe. "Obviously, the size distribution analysis of these products is essential in the R&D process as well as in quality control. With Quanta Morphologi the first absolute sizing technique has become available that routinely enables the size and shape analysis of individual nanoparticles in polydisperse products."

"Quanta Morphologi is the result of our joint development partnership with FEI and we are excited by its innovative performance," commented Ulf Willen, product manager for Malvern Instruments. "We believe users will easily recognize the important benefits delivered by this solution."

The low-vacuum capability of FEI's Quanta SEMs offer users the flexibility to analyze materials without imposing many of the traditional SEM sample preparation constraints, thereby greatly extending the applicability for particle analysis. Malvern's Morphologi particle image analysis software is a proven solution already used on Malvern systems that encompass traditional optical microscopes, such as the Morphologi G3, used by many research and industrial users around the world.

The Quanta Morphologi will be featured this week at FEI's booth 1447 at the Pittsburgh Conference (Pittcon), March 1-7, in New Orleans. It will also be the focus of a special webinar sponsored by FEI and Malvern Instruments on March 19 at 2:00 p.m. eastern daylight time. Interested parties can register in advance for the webinar and obtain more information about the product at www.fei.com/ParticleAnalysis.

####

About FEI Company
FEI (Nasdaq: FEIC) is a world leader in pioneering industry-leading technologies and applications that deliver imaging solutions for 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström level. Our customers, working in advanced research and manufacturing, are supported by field-experienced applications specialists and open access to FEI’s prestigious global user network so they can succeed in accelerating nanoscale discovery and contribute to better living through new product commercialization. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where our world-class community of customers and specialists collaborate on the ongoing development of new ideas and innovative solutions. FEI has sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

About Malvern Instruments

Malvern Instruments is a global company that develops, manufactures and markets advanced analytical systems used in characterizing a wide variety of materials, from bulk powders to nanomaterials and delicate macromolecules. Innovative technologies and powerful software produce systems that deliver industrially relevant data enabling customers to make the connection between micro (eg particle size) and macro (bulk) material properties (rheology) and chemical composition (chemical imaging). Malvern solutions are proven in sectors from cement to pharmaceuticals and support the understanding, improvement and optimization of many industrial processes. Extensive industry experience and analytical expertise enable Malvern to deliver exceptional support to customers worldwide. www.malvern.com.

This news release contains forward-looking statements that include statements about introduction of our new Quanta Morphologi product and applications. Factors that could affect these forward-looking statements include but are not limited to delays in manufacturing and shipping the product; failure of the product to perform as expected; technical problems arising during the product release phase; and problems with our suppliers and partners. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Mind-Write Communications
Sandy Fewkes, +1-408-224-4024

or
Malvern
Trish Appleton, Public Relations
+44 (0) 1480 471117

Copyright © Business Wire 2008

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Imaging

MEMS chips get metatlenses: Combining metasurface lenses with MEMS technology could add high-speed scanning and enhance focusing capability of optical systems February 21st, 2018

Atomic structure of ultrasound material not what anyone expected February 21st, 2018

News and information

MEMS chips get metatlenses: Combining metasurface lenses with MEMS technology could add high-speed scanning and enhance focusing capability of optical systems February 21st, 2018

Atomic structure of ultrasound material not what anyone expected February 21st, 2018

Oxford Instruments announces Dr Kate Ross as winner of the 2018 Lee Osheroff Richardson Science Prize for North and South America February 20th, 2018

Software

Laboratory Management Web Application Goes Nationwide January 9th, 2018

EC Project Aims at Creating and Commercializing Cyber-Physical-System Solutions November 14th, 2017

Leti Launches Emulator Service to Boost ROI and Speed Time to Market for European Chipmakers: Anchored by Mentor Veloce Emulator Machine, Leti’s Offer Includes Support for Design, Debug and Analysis of Results August 31st, 2017

Technology Companies Join Forces for TEM Imaging and Analysis August 3rd, 2017

Announcements

MEMS chips get metatlenses: Combining metasurface lenses with MEMS technology could add high-speed scanning and enhance focusing capability of optical systems February 21st, 2018

Atomic structure of ultrasound material not what anyone expected February 21st, 2018

Oxford Instruments announces Dr Kate Ross as winner of the 2018 Lee Osheroff Richardson Science Prize for North and South America February 20th, 2018

Computers aid discovery of new, inexpensive material to make LEDs with high color quality February 20th, 2018

Tools

MEMS chips get metatlenses: Combining metasurface lenses with MEMS technology could add high-speed scanning and enhance focusing capability of optical systems February 21st, 2018

Oxford Instruments announces Dr Kate Ross as winner of the 2018 Lee Osheroff Richardson Science Prize for North and South America February 20th, 2018

New method enables high-resolution measurements of magnetism February 7th, 2018

Nanometrics Selected for Fab-Wide Process Control Metrology by Domestic China 3D-NAND Manufacturer: Latest Fab Win Includes Comprehensive Suite for Substrate, Thin Film and Critical Dimension Metrology February 7th, 2018

Events/Classes

European & Korean Project To Demo World’s First 5G Platform During Winter Games February 15th, 2018

Leti’s Chief Scientist Presents Optimistic Vision for Neuromorphic Hardware and Ultra-Low-Power Microdevices for Edge Computing at ISSCC: Leti’s Chief Scientist Presents Optimistic Vision for Neuromorphic Hardware and Ultra-Low-Power Microdevices That Are Based on Novel Emerging February 13th, 2018

Leti Chief Scientist Barbara De Salvo Will Help Kick Off ISSCC 2018 with Opening-Day Keynote: In Addition, Leti Scientists Will Present and Demo New Technology for Piezoelectric Energy Harvesting February 8th, 2018

Leti Presents Optical-Equipment Curving Technology that Improves Performance, Cuts Costs: ‘Disruptive Approach’ for Imaging Applications Presented in Paper At Photonics West and Demonstrated in Leti’s Booth February 2nd, 2018

Alliances/Trade associations/Partnerships/Distributorships

New era in high field superconducting magnets – opening new frontiers in science, nanotechnology and materials discovery January 9th, 2018

Leti Field Trials Demonstrate New Multicarrier Waveform for Rural, Maritime Broadband Radio: Field Trial in Orkney Islands Used New Filtered Multicarrier Waveform at 700MHz Band with Flexible Bandwidth Usage (Fragmented and Continuous Spectrum) December 18th, 2017

A new product to help combat mouldy walls, thanks to technology developed at the ICN2 December 14th, 2017

JPK Instruments announce partnership with Swiss company, Cytosurge AG. The partnership makes Cytosurge’s FluidFM® technology available on the JPK NanoWizard® AFM platform December 8th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project