Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Agilent Technologies Introduces Surface Imaging and Analysis Software to Extend Atomic Force Microscope Utility

Abstract:
Agilent Technologies, Inc. (NYSE: A) today introduced Pico Image, a modular atomic force microscope (AFM) imaging and analysis software package designed for AFM users working in a wide range of research applications, including life sciences and material sciences. Pico Image analyzes image data and generates dynamic, highly detailed surface analysis reports with unprecedented power and ease.

Agilent Technologies Introduces Surface Imaging and Analysis Software to Extend Atomic Force Microscope Utility

Chandler, AZ | Posted on January 17th, 2008

"Pico Image has now been integrated into the PicoView software platform for our complete line of AFMs, including the 5400 and 5500," said Jeff Jones, operations manager for Agilent's AFM facility in Chandler, Arizona. "Pico Image allows our customers to easily visualize and analyze the structures and properties of their samples."

Each Pico Image analysis document consists of a set of frames containing: surfaces, profiles extracted from surfaces, the results of applying filters and other operators, analytical studies, and 2D and 3D parameters that conform to international standards. Real-time 3D imaging provides excellent visualization. Videos of flight paths over a surface can also be integrated into Pico Image presentations. The software's intuitive desktop publishing interface, comprehensive online help, and multilanguage support enhance ease of use.

Pico Image contains three performance levels, offering feature sets that meet the needs of basic, advanced, and expert users, respectively. Sophisticated functions include the ability to convert a surface into a series of profiles, compute the similarity of different surfaces, generate sub-surfaces, and perform fractal analysis. Particle analysis and statistics options are also offered. Standalone and network licenses are available.

AFM Instrumentation from Agilent Technologies

Agilent Technologies offers high-precision, modular AFM solutions for research, industry, and education. Exceptional worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories ensure the continued, timely introduction and optimization of innovative, easy-to-use AFM technologies.

####

About Agilent Technologies, Inc.
Agilent Technologies Inc. (NYSE: A) is the worldís premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The companyís 19,000 employees serve customers in more than 110 countries. Agilent had net revenues of $5.4 billion in fiscal 2007.

For more information, please click here

Contacts:
EDITORIAL CONTACT:
Joan Horwitz
+1 480 756 5905

Copyright © Agilent Technologies, Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Imaging

FEI Celebrates Shipment of 1,000th Helios DualBeam System: FEIís Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil & gas industries August 31st, 2016

Diamonds and quantum information processing on the nano scale August 31st, 2016

News and information

FEI Celebrates Shipment of 1,000th Helios DualBeam System: FEIís Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil & gas industries August 31st, 2016

Colors from darkness: Researchers develop alternative approach to quantum computing August 31st, 2016

Diamonds and quantum information processing on the nano scale August 31st, 2016

Software

Park Systems Launches Park NX20 300mm Research Atomic Force Microscope with Full 300 mm Semiconductor Wafer Scan - Vastly Improving Productivity August 3rd, 2016

An accelerated pipeline to open materials research: ORNL workflow system unites imaging, algorithms, and HPC to advance materials discovery and design July 24th, 2016

Nanosystem and Digital Surf launch NanoMap Alpha: New surface imaging & metrology software based on Mountainsģ Technology July 14th, 2016

Leti Develops 3D Network-on-chip to Boost High-performance Computing: Fabrication-ready Hardware-plus-software Communications Solution Boosts Performance, Reduces Energy Consumption July 14th, 2016

Announcements

FEI Celebrates Shipment of 1,000th Helios DualBeam System: FEIís Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil & gas industries August 31st, 2016

Colors from darkness: Researchers develop alternative approach to quantum computing August 31st, 2016

Diamonds and quantum information processing on the nano scale August 31st, 2016

Device to control 'color' of electrons in graphene provides path to future electronics August 31st, 2016

Tools

FEI Celebrates Shipment of 1,000th Helios DualBeam System: FEIís Helios Family has lead the DualBeam technology race and is widely used across the semiconductor, materials science, life sciences and oil & gas industries August 31st, 2016

Diamonds and quantum information processing on the nano scale August 31st, 2016

Designing ultrasound tools with Lego-like proteins August 29th, 2016

Nanofiber scaffolds demonstrate new features in the behavior of stem and cancer cells August 25th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic