Home > News > 25 years of scanning probe microscopy and no standards yet
May 25th, 2007
25 years of scanning probe microscopy and no standards yet
Abstract:
It has been 25 years since the scanning tunneling microscope (STM) was invented, followed four years later by the atomic force microscope, and that's when nanoscience and nanotechnology really started to take off. Various forms of scanning probe microscopes based on these discoveries are essential for many areas of today's research. Scanning probe techniques have become the workhorse of nanoscience and nanotechnology research. Given the 25-year development timeframe, it is surprising that even today there is no generally accepted standard for scanning probe microscopy (SPM). There is no unified SPM terminology, nor is there a standard for data management and treatment, making access and processing of SPM data collected by different types of instruments an error-prone exercise. SPM standardization has only recently begun as part of an effort by the International Organization for Standardization (ISO) the largest developer of industrial standards. Meanwhile the development of SPM instruments and analysis software continues, increasing the already large family of scanning probe microscopy.
Source:
nanowerk.com
Related News Press |
Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers/Posters
Researchers develop artificial building blocks of life March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||