Home > News > X-Tek announces new features for the Revolution X-ray inspection system
April 24th, 2007
X-Tek announces new features for the Revolution X-ray inspection system
Abstract:
The X-Tek Group announces the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system at the Nepcon Shanghai Show.
X-Tek's cutting edge Revolution system will be exhibited at the X-Tek stand (4D03), where visitors will be able to experience the advanced 3D imaging capability of Computerized Tomography (C.T.).
Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the X-Tek Inspect-X image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
Source:
emsnow.com
Bookmark:
| Related News Press |
Announcements
Decoding hydrogen‑bond network of electrolyte for cryogenic durable aqueous zinc‑ion batteries January 30th, 2026
COF scaffold membrane with gate‑lane nanostructure for efficient Li+/Mg2+ separation January 30th, 2026
Tools
Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026
From sensors to smart systems: the rise of AI-driven photonic noses January 30th, 2026
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||