Nanotechnology Now - News Story: NIST Report Addresses Scientific and Technical Measurement Challenges Key to Sustaining U.S. Innovation

Home > News > NIST Report Addresses Scientific and Technical Measurement Challenges Key to Sustaining U.S. Innovation

February 12th, 2007

NIST Report Addresses Scientific and Technical Measurement Challenges Key to Sustaining U.S. Innovation

Abstract:
A new report based on an analysis of more than 700 scientific and technical measurement challenges facing U.S. industry today, calls on the public and private sectors to address those challenges by crafting a "strategic, long-term approach" designed to sustain U.S. innovation at a world-leading pace.

The call for collaboration is one of several key messages contained in An Assessment of the United States Measurement System: Addressing Measurement Barriers to Accelerate Innovation, a new report from the Commerce Department's National Institute of Standards and Technology (NIST).

The reportis the product of a NIST-led survey and analysis of measurement-related needs for supporting innovation across a sample of 11 industrial sectors and technology areas. These ranged from materials to software and from building and construction to nanotechnology. In all, more than 1,000 people in industry, academia and government were involved in the study. Examples of the measurement challenges identified included the need for versatile, high-accuracy methods to measure the three-dimensional geometry of manufactured products and the need for tools for measuring the properties of nanodevices and materials.

Source:
allamericanpatriots.com

Bookmark: