Home > News > FEI Launches Top-of-the-Line Research DualBeam
July 31st, 2006
FEI Launches Top-of-the-Line Research DualBeam
Abstract:
The next generation of combined focused ion beam (FIB) and scanning electron microscope (SEM)
technology for research will be unveiled today when FEI Company (Nasdaq: FEIC) releases its all-new Helios NanoLab(TM) DualBeam(TM) at Microscopy and Microanalysis 2006 in Chicago.
Source:
prnewswire
Bookmark:
| Related Links |
Microscopy and Microanalysis 2006
| Related News Press |
Announcements
A fundamentally new therapeutic approach to cystic fibrosis: Nanobody repairs cellular defect April 17th, 2026
UC Irvine physicists discover method to reverse ‘quantum scrambling’ : The work addresses the problem of information loss in quantum computing system April 17th, 2026
Tools
Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026
From sensors to smart systems: the rise of AI-driven photonic noses January 30th, 2026
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||