Home > News > Advanced microscope installed for materials analysis
November 17th, 2005
Advanced microscope installed for materials analysis
Abstract:
Ohio State University's Center for Accelerated Maturation of Materials (CAMM) has begun using the FEI Titan 80-300 microscope, reported to be the world's highest-resolution, commercially available, scanning/transmission electron microscope (S/TEM).
Source:
manufacturing.net
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