Home > News > Advanced microscope installed for materials analysis
November 17th, 2005
Advanced microscope installed for materials analysis
Abstract:
Ohio State University's Center for Accelerated Maturation of Materials (CAMM) has begun using the FEI Titan 80-300 microscope, reported to be the world's highest-resolution, commercially available, scanning/transmission electron microscope (S/TEM).
Source:
manufacturing.net
Related News Press |
Investments/IPO's/Splits
Daikin Industries becomes OCSiAl shareholder July 27th, 2021
INBRAIN Neuroelectronics raises over €14M to develop smart graphene-based neural implants for personalised therapies in brain disorders March 26th, 2021
180 Degree Capital Corp. Issues Second Open Letter to the Board and Shareholders of Enzo Biochem, Inc. March 26th, 2021
Materials/Metamaterials/Magnetoresistance
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Focused ion beam technology: A single tool for a wide range of applications January 12th, 2024
Announcements
What heat can tell us about battery chemistry: using the Peltier effect to study lithium-ion cells March 8th, 2024
Nanoscale CL thermometry with lanthanide-doped heavy-metal oxide in TEM March 8th, 2024
Tools
Ferroelectrically modulate the Fermi level of graphene oxide to enhance SERS response November 3rd, 2023
The USTC realizes In situ electron paramagnetic resonance spectroscopy using single nanodiamond sensors November 3rd, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||