Home > News > NANOSENSORS™ Announces New high-Q AFM probe
October 29th, 2005
NANOSENSORS™ Announces New high-Q AFM probe
Abstract:
NANOSENSORS™ today announced the Q30K-Plus, a novel scanning proximity probe with a very high Q-factor and an enhanced signal to noise ratio for UHV applications.
Source:
prweb
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