Nanotechnology Now - News Story: Xradia Announces X-ray Fluorescence Imaging Tool

Home > News > Xradia Announces X-ray Fluorescence Imaging Tool

July 11th, 2005

Xradia Announces X-ray Fluorescence Imaging Tool

Abstract:
X-ray microscopy company Xradia Inc. announced today the release of a new element-specific x-ray imaging tool for semiconductor metrology, Scanning Electron Microscopes and Electron Probe Micro Analyzers.

Source:
businesswire

Bookmark:

Related News Press

Announcements

A fundamentally new therapeutic approach to cystic fibrosis: Nanobody repairs cellular defect April 17th, 2026

Qjump: Shallow-circuit quantum sampling guides combinatorial optimization On up to 104 superconducting qubits, Qjump assists in searching the ground states of hard Ising problems and might outperform simulated annealing on near-term quantum hardware April 17th, 2026

Rice study resolves decades-old mystery in organic light-emitting crystals: Findings reveal how molecular defects can enhance light conversion efficiency: April 17th, 2026

UC Irvine physicists discover method to reverse ‘quantum scrambling’ : The work addresses the problem of information loss in quantum computing system April 17th, 2026

Tools

Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026

From sensors to smart systems: the rise of AI-driven photonic noses January 30th, 2026

Gap-controlled infrared absorption spectroscopy for analysis of molecular interfaces: Low-cost spectroscopic approach precisely analyzes interfacial molecular behavior using ATR-IR and advanced data analysis October 3rd, 2025

Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025



Premium Products


	Only the news you want to read! Learn More



	Full-service, expert consulting Learn More




	The latest news from around the world, FREE