Home > News > Conductive tips for atomic force microscopy
May 24th, 2005
Conductive tips for atomic force microscopy
Abstract:
Researchers in Switzerland have tested an atomic force microscope with an electrically insulated conductive tip. The scientists, from the University of Basel and University of Neuchâtel, imaged the hexagonally packed intermediate layer of the red bacterium Deinococcus radiodurans.
“This is the first time that an image of better than 10 nm resolution has been generated using the Faraday current,” Andreas Engel of the University of Basel.
Source:
nanotechweb
| Related News Press |
Possible Futures
Decoding hydrogen‑bond network of electrolyte for cryogenic durable aqueous zinc‑ion batteries January 30th, 2026
COF scaffold membrane with gate‑lane nanostructure for efficient Li+/Mg2+ separation January 30th, 2026
Announcements
Decoding hydrogen‑bond network of electrolyte for cryogenic durable aqueous zinc‑ion batteries January 30th, 2026
COF scaffold membrane with gate‑lane nanostructure for efficient Li+/Mg2+ separation January 30th, 2026
Tools
Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026
From sensors to smart systems: the rise of AI-driven photonic noses January 30th, 2026
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
|
|
||
|
|
||
| The latest news from around the world, FREE | ||
|
|
||
|
|
||
| Premium Products | ||
|
|
||
|
Only the news you want to read!
Learn More |
||
|
|
||
|
Full-service, expert consulting
Learn More |
||
|
|
||