Home > News > FEI Announces World's Most Advanced Electron Microscope
April 18th, 2005
FEI Announces World's Most Advanced Electron Microscope
Abstract:
FEI today announced its new scanning/transmission electron microscope (S/TEM), the Titan(TM)
80-300, dedicated to corrected microscopy. The new (S)TEM system is the world's most advanced commercially-available microscope, yielding atomic-scale imaging with resolution below 0.7 Angstrom.
Source:
prnewswire
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