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April 18th, 2005

FEI Announces World's Most Advanced Electron Microscope

Abstract:
FEI today announced its new scanning/transmission electron microscope (S/TEM), the Titan(TM)
80-300, dedicated to corrected microscopy. The new (S)TEM system is the world's most advanced commercially-available microscope, yielding atomic-scale imaging with resolution below 0.7 Angstrom.

Source:
prnewswire

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