Home > News > Ascend claims breakthrough to simplify TAM analysis
September 29th, 2004
Ascend claims breakthrough to simplify TAM analysis
Abstract:
Ascend Instruments Inc. on Wednesday (Sept. 29) claimed to have devised a new technique that eliminates most of the steps in transmission electron microscopy (TAM), based on focused ion beam (FIB) technology.
Ascend Instruments
Source:
* siliconstrategies
Bookmark:
Announcements
New nanoparticle could make cancer treatment safer, more effective: Scientists create a tiny particle for use with focused ultrasound on solid tumors May 16th, 2025
A new study provides insights into cleaning up noise in quantum entanglement:When it comes to purifying quantum entanglement, new theoretical work highlights the importance of tailoring noise-minimizing solutions to specific quantum systems May 16th, 2025
Following the folds – with quantum technology: The connection between a crumpled sheet of paper and quantum technology: A research team at the EPFL in Lausanne (Switzerland) and the University of Konstanz (Germany) uses topology in microwave photonics to make improved systems of May 16th, 2025
New gel could boost coral reef restoration: The substance, applied to surfaces as a coating, improved coral larvae settlement by up to 20 times in experiments compared to untreated surfaces May 16th, 2025
Tools
Portable Raman analyzer detects hydrogen leaks from a distance: Device senses tiny concentration changes of hydrogen in ambient air, offering a dependable way to detect and locate leaks in pipelines and industrial systems April 25th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
New material to make next generation of electronics faster and more efficient With the increase of new technology and artificial intelligence, the demand for efficient and powerful semiconductors continues to grow November 8th, 2024
