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Home > News > Zyvex Announces New IC Probing Application

April 2nd, 2004

Zyvex Announces New IC Probing Application

Abstract:
Zyvex Corporation today announced a breakthrough probing application for integrated circuit (IC) defect analysis. Zyvex enables rapid-response semiconductor device failure analysis at the contact level for better, faster, and cheaper IC development - features that are critical to the highly-competitive semiconductor industry.

Source:
PRNewswire

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