Home > News > SPM for everyone
February 26th, 2004
SPM for everyone
Abstract:
During the last decade, the scanning probe microscope (SPM) has developed to a point where it is now an accessible, easy-to-use nanotechnology research tool. The original scanning tunneling microscope has evolved into many new instruments, the first being the atomic force microscope (AFM), which have been used to observe nearly every physical property of a surface that it is possible to measure.
Source:
Materials Today
Bookmark:
| Related News Press |
Tools
Metasurfaces smooth light to boost magnetic sensing precision January 30th, 2026
From sensors to smart systems: the rise of AI-driven photonic noses January 30th, 2026
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||