Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > FEI Unveils New Solutions for Faster Time-to-Analysis in Metals Research

Abstract:
New Helios DualBeam uses a plasma focused ion beam for high-throughput milling, while the new Teneo scanning electron microscope provides high-resolution, high-contrast images and fast, precise analytical results.

FEI Unveils New Solutions for Faster Time-to-Analysis in Metals Research

Hillsboro, OR | Posted on July 30th, 2014

FEI (NASDAQ: FEIC) today announced two new products that speed up the imaging and analysis time for metals researchers and industrial failure analysis labs. The Helios™ PFIB DualBeam™, the first DualBeam within FEI's product portfolio to include a plasma-based focused ion beam (PFIB), mills 20 - 50 times faster than gallium-based FIBs to deliver rapid, three-dimensional (3D) imaging and analysis. The Teneo™ scanning electron microscope (SEM) provides high-resolution, high-contrast images and fast, precise analytical results, enabling researchers to clearly resolve grain boundaries, interfaces and structure/topography of difficult-to-image magnetic and nonconductive samples.

"Global investment in metals research is increasing for industrial, building and environmental applications," states Trisha Rice, vice president and general manager of Materials Science for FEI. "Successful characterization of metals and magnetic materials requires high-resolution, high-contrast images and fast, precise analytical results. In addition, the ability to mill very quickly through large features and zoom in to image and analyze fine details is also important in multi-scale analysis, which involves connecting macro-scale properties of materials to nano-scale structure. Our new Helios PFIB DualBeam significantly increases milling speed as well as the size of features that can be studied."

Current gallium-based FIBs have been used traditionally to prepare TEM samples, perform cross-sections and provide 3D analysis, but the scales are limited due to the time that the milling process requires, which can be many days for larger scales. The Helios PFIB DualBeam can do the same work in hours, increasing throughput and the size of features that can be studied. In addition to metals research, the delamination of paints and coatings and analysis of grain boundaries, thin films, interfaces and adhesion layers are potential application for the new Helios PFIB DualBeam.

"The Vion™ PFIB was the first FEI product to incorporate plasma source technology when we launched it three years ago as a single-beam FIB for failure analysis of advanced integrated circuits," states Rice. "We understand this technology and our customers' needs in great detail. The knowledge we gained from our experience with the single beam tool has enabled us to design the new DualBeam with key features that specifically address the challenges of integrating a fast-milling plasma FIB in a DualBeam system."

Rice adds, "Our new Teneo SEM meets the needs of metal researchers for powerful imaging and highly precise analysis. At the same time, its flexibility and high performance over a broad range of applications make it an excellent solution for multi-user laboratories."

The Teneo SEM includes a unique, non-immersion objective lens that is specifically-designed to deliver high-resolution on magnetic materials. Together, this lens and FEI's Trinity™ detection scheme deliver high image contrast from a wide variety of materials, especially magnetic materials, alloys and composites. Fast analytical capabilities, including energy dispersive spectrometry (EDS) and electron backscatter diffraction (EBSD), are supported by high-beam current and full 90-degree stage tilt.

The highly-configurable platform includes optional low-vacuum capability for imaging of nonconductive samples, such as glass, ceramics and polymers. Multi-user laboratory environments will also benefit from the ease-of-use of the Teneo SEM, for example, most users, regardless of experience level, can leverage step-by-step workflows to get useful results more quickly.

For more information, please visit http://www.fei.com/materials-science/metals/. Or stop by the FEI booth (#916) at the Microscopy & Microanalysis (M&M) 2014 Exhibition, August 3-7, at the Connecticut Convention Center, Hartford, CT, USA. FEI will also be at the International Microscopy Congress (booth 6), September 7-12, in Prague, Czech Republic.

####

About FEI Company
FEI Company (Nasdaq: FEIC) designs, manufactures and supports a broad range of high-performance microscopy workflow solutions that provide images and answers at the micro-, nano- and picometer scales. Its innovation and leadership enable customers in industry and science to increase productivity and make breakthrough discoveries. Headquartered in Hillsboro, Ore., USA, FEI has over 2,600 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Helios PFIB DualBeam, Teneo SEM, and Trinity detection scheme. Factors that could affect these forward-looking statements include but are not limited to our ability to manufacture, ship, deliver and install the tools or software as expected; failure of the product or technology to perform as expected; unexpected technology problems and challenges; changes to the technology; the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results; and the inability of the customer to deploy the tools or develop and deploy the expected new applications. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information, please click here

Contacts:
Sandy Fewkes (media contact)
MindWrite Communications, Inc.
+1 408 224 4024


FEI Company
Jason Willey (investors and analysts)
Investor Relations Director
+1 503 726 2533

Copyright © FEI Company

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Basque researchers turn light upside down February 23rd, 2018

Stiffness matters February 23rd, 2018

Imaging individual flexible DNA 'building blocks' in 3-D: Berkeley Lab researchers generate first images of 129 DNA structures February 22nd, 2018

'Memtransistor' brings world closer to brain-like computing: Combined memristor and transistor can process information and store memory with one device February 22nd, 2018

Imaging

Histology in 3-D: New staining method enables Nano-CT imaging of tissue samples February 22nd, 2018

Imaging individual flexible DNA 'building blocks' in 3-D: Berkeley Lab researchers generate first images of 129 DNA structures February 22nd, 2018

Announcements

Basque researchers turn light upside down February 23rd, 2018

Stiffness matters February 23rd, 2018

Histology in 3-D: New staining method enables Nano-CT imaging of tissue samples February 22nd, 2018

Developing reliable quantum computers February 22nd, 2018

Tools

Basque researchers turn light upside down February 23rd, 2018

Histology in 3-D: New staining method enables Nano-CT imaging of tissue samples February 22nd, 2018

Imaging individual flexible DNA 'building blocks' in 3-D: Berkeley Lab researchers generate first images of 129 DNA structures February 22nd, 2018

MEMS chips get metatlenses: Combining metasurface lenses with MEMS technology could add high-speed scanning and enhance focusing capability of optical systems February 21st, 2018

Industrial

Ultra-efficient removal of carbon monoxide using gold nanoparticles on a molecular support: New method and mechanism for state-of-the-art gas purification February 9th, 2018

A simple new approach to plastic solar cells: Osaka University researchers intelligently design new highly efficient organic solar cells based on amorphous electronic materials with potential for easy printing January 28th, 2018

Nature paper by Schlumberger researchers used photothermal based nanoscale IR spectroscopy to analyze heterogeneous process of petroleum generation January 23rd, 2018

New filters could enable manufacturers to perform highly-selective chemical separation January 23rd, 2018

Events/Classes

European & Korean Project To Demo World’s First 5G Platform During Winter Games February 15th, 2018

Leti’s Chief Scientist Presents Optimistic Vision for Neuromorphic Hardware and Ultra-Low-Power Microdevices for Edge Computing at ISSCC: Leti’s Chief Scientist Presents Optimistic Vision for Neuromorphic Hardware and Ultra-Low-Power Microdevices That Are Based on Novel Emerging February 13th, 2018

Leti Chief Scientist Barbara De Salvo Will Help Kick Off ISSCC 2018 with Opening-Day Keynote: In Addition, Leti Scientists Will Present and Demo New Technology for Piezoelectric Energy Harvesting February 8th, 2018

Leti Presents Optical-Equipment Curving Technology that Improves Performance, Cuts Costs: ‘Disruptive Approach’ for Imaging Applications Presented in Paper At Photonics West and Demonstrated in Leti’s Booth February 2nd, 2018

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project