Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > New JEOL-Nikon MiXcroscopy Correlative Imaging Solution

Abstract:
JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope (SEM). The specimen stage registration is fully controlled by dedicated software that allows the OM and SEM to share, recall and observe exact locations of specific areas on the specimens.

New JEOL-Nikon MiXcroscopy Correlative Imaging Solution

Peabody, MA | Posted on March 27th, 2014

The Nikon ECLIPSE LV-N series optical microscope and any of the JEOL JSM-7000 series Field Emission SEMs work concurrently as the optical image taken on the OM, along with specimen stage coordinates, are transferred to the SEM for navigation and correlation via Nikon's Elements software. When the sample holder is moved to the SEM, the researcher can observe detailed structures at higher magnifications and easily compare to the optical image on screen.


JEOL and Nikon have recently announced a business alliance that includes development of correlative microscopy techniques. Nikon has represented the JEOL benchtop SEM, the NeoScope, since its introduction in 2008.

####

For more information, please click here

Contacts:
Patricia Corkum
978-536-2273

Copyright © JEOL USA

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related Links

Video:

Related News Press

News and information

The next step in DNA computing: GPS mapping? May 6th, 2015

Improving Clinical Care and Patient Quality of Life in Advanced Liver Disease, d-LIVER Workshop, Milan, 27 May 2015 May 6th, 2015

Grafoid Acquires MuAnalysis Inc; Expands Its Advanced Materials Testing Capabilities May 6th, 2015

Winner Announced for NNI’s First ‘EnvisioNano’ Nanotechnology Image Contest May 6th, 2015

Imaging

Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015 May 5th, 2015

Iranian Scientists Present Model to Study Mechanical Vibrations of Structures Containing Nanocomposites May 5th, 2015

The random raman laser: A new light source for the microcosmos May 4th, 2015

Time Dependant Spectroscopy of Microscopic Samples: CRAIC TimePro™ software is used with CRAIC Technologies microspectrometers to measure the kinetic UV-visible-NIR, Raman and fluorescence spectra of microscopic sample areas May 2nd, 2015

Announcements

The next step in DNA computing: GPS mapping? May 6th, 2015

Improving Clinical Care and Patient Quality of Life in Advanced Liver Disease, d-LIVER Workshop, Milan, 27 May 2015 May 6th, 2015

Grafoid Acquires MuAnalysis Inc; Expands Its Advanced Materials Testing Capabilities May 6th, 2015

Winner Announced for NNI’s First ‘EnvisioNano’ Nanotechnology Image Contest May 6th, 2015

Tools

Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015 May 5th, 2015

Iranian Scientists Present Model to Study Mechanical Vibrations of Structures Containing Nanocomposites May 5th, 2015

Nanometrics to Present at the B. Riley & Co. 16th Annual Investor Conference May 2nd, 2015

Time Dependant Spectroscopy of Microscopic Samples: CRAIC TimePro™ software is used with CRAIC Technologies microspectrometers to measure the kinetic UV-visible-NIR, Raman and fluorescence spectra of microscopic sample areas May 2nd, 2015

Alliances/Partnerships/Distributorships

Silicon Storage Technology and GLOBALFOUNDRIES Announce Qualification of Automotive Grade 55nm Embedded Flash Memory Technology May 5th, 2015

How can you see an atom? (video) April 10th, 2015

FibeRio and VF Corporation Form Strategic Partnership to Lead the Apparel and Footwear Markets in Nanofiber Technology April 8th, 2015

UK National Graphene Institute Selects Bruker as Official Partner: World-Leading Graphene Research Facility Purchases Multiple Bruker AFMs April 7th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project