- About Us
- Career Center
- Nano-Social Network
- Nano Consulting
- My Account
JEOL and Nikon have integrated optical microscopy and field emission scanning electron microscopy in a way that enables seamless observation of the same region of interest on a sample with fast, accurate navigation. The technique, MiXcroscopy, employs the same specimen holder for both the optical microscope (OM) and the scanning electron microscope (SEM). The specimen stage registration is fully controlled by dedicated software that allows the OM and SEM to share, recall and observe exact locations of specific areas on the specimens.
The Nikon ECLIPSE LV-N series optical microscope and any of the JEOL JSM-7000 series Field Emission SEMs work concurrently as the optical image taken on the OM, along with specimen stage coordinates, are transferred to the SEM for navigation and correlation via Nikon's Elements software. When the sample holder is moved to the SEM, the researcher can observe detailed structures at higher magnifications and easily compare to the optical image on screen.
JEOL and Nikon have recently announced a business alliance that includes development of correlative microscopy techniques. Nikon has represented the JEOL benchtop SEM, the NeoScope, since its introduction in 2008.
For more information, please click here
Copyright © JEOL USAIf you have a comment, please Contact us.
Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
|Related News Press|
News and information
Nanoantenna lighting-rod effect produces fast optical switches October 24th, 2016
Crystal clear imaging: Infrared brings to light nanoscale molecular arrangement: Berkeley Lab and University of Colorado-Boulder team develop new way to reveal crystal features in functional materials October 17th, 2016
New nanomedicine approach aims to improve HIV drug therapies October 24th, 2016
Nanosciences: Genes on the rack October 21st, 2016
STMicroelectronics’ Semiconductor Chips Contribute to Connected Toothbrush from Oral-B That Sees What You Don’t: Microcontroller and Accelerometer help brushers clean their teeth more effectively October 4th, 2016
Leti to Tackle Tomorrow's Research Strategies with Stanford University’s SystemX Alliance: French R&D Center Is the First Research Institute to Join the Collaboration and Provides Bridges Between Academia and Industry, Leveraging Alliance’s Potential October 4th, 2016