Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Agilent Technologies Enhances Application Versatility of Atomic Force Microscope for Studying Large and Small Samples

Abstract:
Agilent Technologies Inc. (NYSE: A) today announced the availability of 300 mm x 300 mm and multisample two-inch-wafer stages for its large-stage 5600LS atomic force microscope. These new stages extend the application versatility of the Agilent 5600LS AFM, which also offers the largest fully addressable and programmable 200 mm x 200 mm stage, plus a special stage adapter for imaging small samples.

Agilent Technologies Enhances Application Versatility of Atomic Force Microscope for Studying Large and Small Samples

Santa Clara, CA | Posted on March 11th, 2013

"With its expanded selection of stages, the modular 5600LS provides researchers an ideal tool for semiconductor, optoelectronics, materials science and life science studies at the nanoscale," said Jeff Jones, general manager for Agilent's nanoinstrumentation facility in Chandler, Ariz. "The 5600LS is the world's finest commercially available AFM that permits imaging of both large samples [in air] and small samples [in air, or in liquid under temperature control]."

The 5600LS system's programmable, motorized stage quickly and accurately positions probes to image and map specimens with 0.5μm precision. Investigators can locate and identify an area of interest and, with the coordinates stored, automatically reposition the sample for further study. Multiple locations can be programmed. The stage easily accommodates either a single sample up to 200 mm in diameter and 30 mm tall or as many as nine small samples with the 200 mm vacuum chuck (more can be held with tape), each of whose locations can be programmed.

The new 300 mm x 300 mm stage allows 5600LS users to handle larger semiconductor wafer samples. Alternatively, the new multisample, two-inch-wafer stage is perfect for research involving optoelectronics and LEDs.

The 5600LS is compatible with all standard imaging modes and with Agilent's unique scanning microwave microscopy (SMM) mode, which combines the compound, calibrated electrical measurement capabilities of a microwave vector network analyzer with the outstanding spatial resolution of an atomic force microscope. SMM mode is particularly useful for testing and characterizing semiconductors. It can be used to measure complex impedance (resistance and reactance) as well as calibrated capacitance and dopant density.

AFM Instrumentation from Agilent

Agilent offers high-precision, modular AFM solutions for research, industry and education. Worldwide support is provided by experienced application scientists and technical service personnel. Agilent's leading-edge R&D laboratories are dedicated to the timely introduction and optimization of innovative and easy-to-use AFM technologies.

####

About Agilent Technologies Inc.
Agilent Technologies Inc. (NYSE: A) is the world’s premier measurement company and a technology leader in chemical analysis, life sciences, diagnostics, electronics, and communications. The company’s 20,500 employees serve customers in more than 100 countries. Agilent had revenues of $6.9 billion in fiscal 2012.

For more information, please click here

Contacts:
Janet Smith
Americas
+1 970 679 5397

Twitter: @JSmithAgilent

Joan Horwitz
nanomeasurement
+1 480 756 5905

Copyright © Agilent Technologies Inc.

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

ICN2 researchers compute unprecedented values for spin lifetime anisotropy in graphene November 17th, 2017

Math gets real in strong, lightweight structures: Rice University researchers use 3-D printers to turn century-old theory into complex schwarzites November 16th, 2017

The stacked color sensor: True colors meet minimization November 16th, 2017

Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017

Nanometrics Announces $50 Million Share Repurchase Program November 15th, 2017

Imaging

The stacked color sensor: True colors meet minimization November 16th, 2017

Announcements

ICN2 researchers compute unprecedented values for spin lifetime anisotropy in graphene November 17th, 2017

Math gets real in strong, lightweight structures: Rice University researchers use 3-D printers to turn century-old theory into complex schwarzites November 16th, 2017

The stacked color sensor: True colors meet minimization November 16th, 2017

Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017

Tools

Nanometrics to Participate in the 6th Annual NYC Investor Summit 2017 November 16th, 2017

Nanometrics Announces $50 Million Share Repurchase Program November 15th, 2017

Nanometrics Board of Directors Names Pierre-Yves Lesaicherre President and CEO November 14th, 2017

Oxford Instruments announces winner of the 2017 Sir Martin Wood Prize for Japan November 14th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project