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Home > Press > Nanometrics Atlas XP+ OCD System Selected as “Tool of Record” at Leading Disk Drive Manufacturer

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced metrology systems, today announced its Atlas® XP+ optical critical dimension (OCD) system has been selected by a leading disk drive manufacturer for process control metrology with follow-on orders at multiple fabs. The system orders follow the successful installation of an initial Atlas XP+ system, which was selected over an incumbent competitive product. In its position as "tool of record," the Atlas system will be used to provide OCD metrology in the production of the customer's next generation thin-film heads.

Nanometrics Atlas XP+ OCD System Selected as “Tool of Record” at Leading Disk Drive Manufacturer

Milpitas, CA | Posted on October 5th, 2011

As drive manufacturers work to increase the performance and density of hard drives by shrinking device geometries, new challenges arise. Among these is the need to achieve uniform device features in thin-film heads. The Atlas XP+ system enables customers to characterize microscopic features and numerous critical parameters of their head designs that can affect performance. The technology provides a fast means of measuring these features and helps manufacturers to achieve higher device yield. To optimize the modeling of structures and accelerate time to data, the Atlas XP+ also leverages Nanometrics' NanoCD™ Suite, a turnkey OCD analysis solution with advanced modeling and intuitive recipe building capabilities.

"Our OCD metrology solution provides information about the most critical features of customers' devices and offers insight that directly correlates to performance and improved yields," said David Doyle, vice president of Nanometrics' Semiconductor Business Unit. "The high-speed Atlas XP+ enables non-destructive, in-line metrology of complex structures, which leads to a higher process control capability and lower overall cost of manufacturing."

"The further penetration of our Atlas XP+ system into important segments such as disk drive manufacturing demonstrates the expanding role of OCD to characterize complex structures used in the most advanced electronic devices," said Dr. Timothy J. Stultz, president and chief executive officer. "Nanometrics' solutions optimize OCD metrology, making it the most precise, data-rich process control metrology available today."

####

About Nanometrics Incorporated
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Select Global Market under the symbol NANO.

Forward Looking Statements

This press release contains forward-looking statements including, but not limited to, statements regarding the capabilities of the company’s metrology products, market leadership and growth of OCD metrology. Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, expectations regarding product capabilities, market share and growth are subject to a number of risks, including changes in customer spending plans and technology roadmaps, worldwide economic conditions and the continued technological leadership of our products. For additional information and considerations regarding the risks faced by Nanometrics, see its annual report on Form 10-K for the year ended January 1, 2011 as filed with the Securities and Exchange Commission, as well as other periodic reports filed with the SEC from time to time. Nanometrics disclaims any obligation to update information contained in any forward-looking statement.

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Contacts:
Company Contact:
Dave Viera
408-545-6000 tel


Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899 tel

Copyright © Nanometrics Incorporated

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