Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Versatile Dual Function Sample Preparation System For SEM

Abstract:
Hitachi High-Technologies has launched the IM4000 Ion Milling system. Used to prepare specimens for scanning electron microscope (SEM) imaging and analytical studies such as EDX and EBSP, the versatile IM4000 is capable of both pin-point cross-section and flat surface ion milling. Cross-section milling provides smooth cross-section specimens for high resolution imaging of subsurface structures, with the cross section position accurately controllable by fine positioning of a beam-shielding mask edge. Flat milling provides uniform polishing of surfaces of 5 mm diameter or more with variable angle milling, to either flatten surfaces or to selectively enhance specimen surface features (relief milling).

Versatile Dual Function Sample Preparation System For SEM

Maidenhead, UK | Posted on August 31st, 2011

The two IM4000 applications - Cross section and flat surface milling - are realised via 2 different removable sample stage units, allowing for convenient specimen setting and cutting edge definition using an external optical microscope.

The IM4000 ion milling system features a new high-current Argon ion gun that delivers cross sectional milling rates of 300μm/hr in Silicon for dramatically reduced cross-sectioning times. The wide Argon ion beam can define sharp cross sections even on samples of dissimilar materials with different hardness that can not be cut or broken without causing material deformations or dislocations. Sensitive materials like polymers or papers can be processed by freely selecting proper lower ion beam energies between 0 and 6kV, without need for special sample cooling.

Wide and smooth flat milled surfaces of approximately 5mm in diameter or more can be achieved within minutes by shifting the centre of the defocused ion beam from the sample rotation or swinging centre. The beam irradiation angle to the specimen surface is selectable from 0° to 90°. This makes the IM4000 useful in a multitude of different fields and applications such as materials, semiconductors, research and quality control.

####

For more information, please click here

Contacts:
Press Enquiries:
Denis Bulgin
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Tel: +44 (0)1763 262621

www.inpress.co.uk

Other Enquiries:
High-Technologies Corporation
Whitebrook Park, Lower Cookham Road
Maidenhead, Berkshire SL6 8YA.
Tel: + 44 (0) 800 316 1500

Copyright © Hitachi High-Technologies Corporation

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Canatu Launches CNB In-Mold Film for Transparent Touch on 3D Surfaces –in Cars, Household Appliances, Wearables, Portables November 20th, 2014

Imaging

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

NRL Scientists Discover Novel Metamaterial Properties within Hexagonal Boron Nitride November 20th, 2014

Spectral Surface Mapping with Microscopic Resolution: CRAIC Technologies introduces Spectral Surface Mapping™ (S2M™) software November 18th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Announcements

New research project supports internationalisation in nano-research: Launch of new “Baltic Sea Network” November 22nd, 2014

3rd Iran-Proposed Nano Standard Approved by International Standard Organization November 22nd, 2014

NMTI announces breakthrough solutions for HAMR nanoantenna for next-generation ultra-high density magnetic storage November 21st, 2014

Nano Sorbents Able to Remove Pollutions Caused by Oil Derivatives November 20th, 2014

Tools

Leica Microsystems Presents Universal Hybrid Detector for Single Molecule Detection and Imaging at SfN and ASCB: Leica HyD SMD - the Optimal Detector for Precise and Reliable SMD data November 20th, 2014

Nanometrics Announces Upcoming Investor Events November 19th, 2014

Two sensors in one: Nanoparticles that enable both MRI and fluorescent imaging could monitor cancer, other diseases November 18th, 2014

Field-emission plug-and-play solution for microwave electron guns: To simplify the electron emission mechanism involved in microwave electron guns, a team of researchers has created and demonstrated a field-emission plug-and-play solution based on ultrananocrystalline diamond November 18th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More












ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE