Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Flat Panel Display Color and Intensity Testing With the New 308 FPD From CRAIC Technologies

Abstract:
The 308 PV0153 from CRAIC Technologies is able to measure the colorimetry and intensities of areas smaller than pixels on a display accurately and rapidly.

Flat Panel Display Color and Intensity Testing With the New 308 FPD From CRAIC Technologies

San Dimas, CA | Posted on November 2nd, 2010

CRAIC Technologies, the leading manufacturer of UV-visible-NIR microscopes and microspectrometers, is pleased to announce the 308 FPD: a spectrophotometer designed to analyze the color and relative intensity of individual pixels of even microdisplays. The system attaches to a probe station or microscope to enable you to obtain color data and relative intensity comparisons for flat panel displays of all types. Also able to measure spectra on the micron scale, the 308 FPD can map the variations due to mura, perform pixel-to-pixel comparisons and can even map spectral variations within a single pixel. With addition of CRAIC Technologies QDI FilmPro software, the 308 FPD can also measure thin film thickness and even cell gap thickness. This provides the display makers with an unparalleled capability to optimize and improve their flat panel display manufacturing process with a multi-faceted test solution: the 308 FPD spectrophotometer.

"Many of our customers want to measure ever smaller features on flat panel displays. With our experience of spectroscopy and imaging on the micron scale, developing the 308 FPD was a logical step for CRAIC Technologies" says Dr. Paul Martin, President.

"The 308 FPD features our proprietary Lightblades spectrophotometers technology for improved performance and enhanced flexibility. This system allows for colorimetry, spectroscopy and intensity measurements on the micron scales that are common to advanced high resolution displays. The 308 FPD can also be configured to measure thin film thickness as well as for imaging. This allows for testing of many aspects of displays with a single instrument."

The 308 FPD solution combines advanced Lightblades spectrophotometers with sophisticated optics and software to enable the user to measure spectra, colorimetry, light intensity and film thickness on the micron scale. As the smallest pixels are now on the order of 10 microns across, the 308 FPD provides the ability to not only measure the color and intensity of the entire display but also to compare pixels to pixels and even map out the changes within a single pixel. Designed for the production environment, it can incorporate automated measurement capabilities, touch screen controls, easily modified processing recipes and sophisticated data analysis tools.

For more information about 308 FPD microspectrophotometer and its applications, visit www.microspectra.com

####

About CRAIC Technologies
CRAIC Technologies, Inc. is a global technology leader focused microimaging and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates innovative solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides solutions for customers in forensic sciences, health sciences, semiconductor, geology, nanotechnology and materials science markets whose applications demand accuracy, precision, speed and the best in customer support.

For more information, please click here

Contacts:
Paul Martin
Phone: 310-573-8180
Fax: 310-573-8182

Copyright © CRAIC Technologies

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Leti IEDM 2016 Paper Clarifies Correlation between Endurance, Window Margin and Retention in RRAM for First Time: Paper Presented at IEDM 2016 Offers Ways to Reconcile High-cycling Requirements and Instability at High Temperatures in Resistive RAM December 6th, 2016

Tokyo Institute of Technology research: 3D solutions to energy savings in silicon power transistors December 6th, 2016

Physicists decipher electronic properties of materials in work that may change transistors December 6th, 2016

Infrared instrumentation leader secures exclusive use of Vantablack coating December 5th, 2016

Display technology/LEDs/SS Lighting/OLEDs

Trace metal recombination centers kill LED efficiency: UCSB researchers warn that trace amounts of transition metal impurities act as recombination centers in gallium nitride semiconductors November 3rd, 2016

Diamond nanothread: Versatile new material could prove priceless for manufacturing: Would you dress in diamond nanothreads? It's not as far-fetched as you might think November 3rd, 2016

Researchers surprised at the unexpected hardness of gallium nitride: A Lehigh University team discovers that the widely used semiconducting material is almost as wear-resistant as diamonds October 31st, 2016

Inspiration from the ocean: An interdisciplinary team of researchers at UC Santa Barbara has developed a non-toxic, high-quality surface treatment for organic field-effect transistors October 18th, 2016

Thin films

Ultra-thin ferroelectric material for next-generation electronics October 12th, 2016

Continuous roll-process technology for transferring and packaging flexible LSI August 29th, 2016

Self-cleaning, anti-reflective, microorganism-resistant coatings: Researchers at the UPV/EHU-University of the Basque Country are modifying surface properties of materials to obtain specific properties at a lower cost August 9th, 2016

Scientists find a way of acquiring graphene-like films from salts to boost nanoelectronics: Physicists use supercomputers to find a way of making 'imitation graphene' from salt July 30th, 2016

Announcements

Leti IEDM 2016 Paper Clarifies Correlation between Endurance, Window Margin and Retention in RRAM for First Time: Paper Presented at IEDM 2016 Offers Ways to Reconcile High-cycling Requirements and Instability at High Temperatures in Resistive RAM December 6th, 2016

Tokyo Institute of Technology research: 3D solutions to energy savings in silicon power transistors December 6th, 2016

Physicists decipher electronic properties of materials in work that may change transistors December 6th, 2016

Infrared instrumentation leader secures exclusive use of Vantablack coating December 5th, 2016

Tools

Deep insights from surface reactions: Researchers use Stampede supercomputer to study new chemical sensing methods, desalination and bacterial energy production December 2nd, 2016

Controlled electron pulses November 30th, 2016

Scientists shrink electron gun to matchbox size: Terahertz technology has the potential to enable new applications November 25th, 2016

News from Quorum: The Agricultural Research Service of the USDA uses a Quorum Cryo-SEM preparation system for the study of mites, ticks and other soft bodied organisms November 22nd, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project