Nanotechnology Now





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanometrics UniFire(TM) Receives 2009 R&D 100 Award for Advanced Film Capability

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs as well as advanced wafer-scale packaging, announced that it has been selected as a recipient of the 2009 R&D 100 Award for its innovative Advanced Film Capability (AFC) technology incorporated in the UniFire line of metrology systems.

Nanometrics UniFire(TM) Receives 2009 R&D 100 Award for Advanced Film Capability

Milpitas, CA | Posted on August 11th, 2009

The R&D 100 Award recognizes the 100 most technologically significant products introduced the past year. Recipients of the annual R&D 100 Award are selected by an independent judging panel and editors of R&D Magazine.

The AFC technology module enables measurement of thickness and optical properties of the individual layers in complex film stacks for in-line process control of semiconductor manufacturing. When incorporated as an option in the UniFire 7900, AFC combines high-precision film metrology with the industry's smallest metrology targets, thereby enabling direct sampling of relevant customer features/structures.

"The spectroscopic and small target capability of AFC is of interest to a large number of customers in the semiconductor industry," commented Michael Darwin, Vice President of the UniFire Business Group at Nanometrics. "In particular, when AFC is used with the UniFire's state of the art interferometry capability, our customers have a unique capability to measure and combine film thickness with die level topography information for control of advanced CMP, lithography, and etch processes in semiconductor manufacturing."

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, advanced wafer-scale packaging, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control, topography, and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process, from front end of line substrate manufacturing through die preparation for advanced packaging. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide.

For more information, please click here

Contacts:
Nanometrics Contact:
Kevin Heidrich
408.545.6000 tel


Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530.265.9899 tel


Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Nanostructures Increase Corrosion Resistance in Metallic Body Implants May 24th, 2015

Iranian Scientists Use Magnetic Field to Transfer Anticancer Drug to Tumor Tissue May 24th, 2015

Basel physicists develop efficient method of signal transmission from nanocomponents May 23rd, 2015

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Display technology/LEDs/SS Lighting/OLEDs

Statement by QD Vision regarding European Parliament’s Vote on Cadmium-Based Quantum Dots May 20th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

CLAIRE brings electron microscopy to soft materials: Berkeley researchers develop breakthrough technique for noninvasive nanoscale imaging May 14th, 2015

QD Vision to Showcase Quantum Dot “Firsts” at Display Week 2015: Executives will present, demo current and future quantum dot technology May 13th, 2015

Chip Technology

Basel physicists develop efficient method of signal transmission from nanocomponents May 23rd, 2015

Nanometrics Announces Live Webcast of Upcoming Investor and Analyst Day May 20th, 2015

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Defects can 'Hulk-up' materials: Berkeley lab study shows properly managed damage can boost material thermoelectric performances May 20th, 2015

Announcements

Nanostructures Increase Corrosion Resistance in Metallic Body Implants May 24th, 2015

Iranian Scientists Use Magnetic Field to Transfer Anticancer Drug to Tumor Tissue May 24th, 2015

Basel physicists develop efficient method of signal transmission from nanocomponents May 23rd, 2015

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Tools

This Slinky lookalike 'hyperlens' helps us see tiny objects: The photonics advancement could improve early cancer detection, nanoelectronics manufacturing and scientists' ability to observe single molecules May 23rd, 2015

Nanometrics Announces Live Webcast of Upcoming Investor and Analyst Day May 20th, 2015

Taking control of light emission: Researchers find a way of tuning light waves by pairing 2 exotic 2-D materials May 20th, 2015

DELMIC announces a workshop hosted by Phenom World on Integrated CLEM to be held on Wednesday June 24th at the Francis Crick Institute (Lincoln Inn Fields Laboratory). May 19th, 2015

Energy

Visualizing How Radiation Bombardment Boosts Superconductivity: Atomic-level flyovers show how impact sites of high-energy ions pin potentially disruptive vortices to keep high-current superconductivity flowing May 23rd, 2015

Conversion of Greenhouse Gases to Syngas in Presence of Nanocatalysts in Iran May 22nd, 2015

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Industrial Nanotech, Inc. Announces Official Launch of the Eagle Platinum Tile™ May 19th, 2015

Grants/Awards/Scholarships/Gifts/Contests/Honors/Records

What makes cancer cells spread? New device offers clues May 19th, 2015

Researchers build new fermion microscope: Instrument freezes and images 1,000 individual fermionic atoms at once May 13th, 2015

International and U.S. Students and Teachers Headed to Toronto for 34th Annual International Space Development Conference®: Students competed in prestigious NSS-NASA Ames Space Settlement Design Contest May 9th, 2015

Pixelligent Technologies Announces $1M Phase-II OLED Lighting Award From the US Department of Energy May 9th, 2015

Solar/Photovoltaic

Efficiency record for black silicon solar cells jumps to 22.1 percent: Aalto University's researchers improved their previous record by over 3 absolute percents in cooperation with Universitat Politècnica de Catalunya May 18th, 2015

Wearables may get boost from boron-infused graphene: Rice U. researchers flex muscle of laser-written microsupercapacitors May 18th, 2015

Random nanowire configurations increase conductivity over heavily ordered configurations May 16th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project