Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > NANOSENSORS˙ introduces AdvancedTEC AFM Probes with Gold and Platinum Coating

Abstract:
NANOSENSORS˙ today announced the introduction of new Gold and Platinum coated variations of its well-known speciality probe type for Atomic Force Microscopy - the AdvancedTEC˙ SPM probe.

NANOSENSORS˙ introduces AdvancedTEC AFM Probes with Gold and Platinum Coating

Switzerland | Posted on May 19th, 2008

The Platinum Iridium and the gold coated AdvancedTEC˙ AFM probes will be available in different force constants and resonant frequencies for contact mode, non-contact/tapping mode and force modulation mode measurements.

These new variations extend the range of applications for the AdvancedTEC to Electrostatic Force Mode (EFM), Scanning ElectroChemical Microscopy (SECM), Scanning Capacitance Mode (SCM), Scanning Kelvin Probe Microscopy (SKPM) as well as to usage in combined imaging techniques such as: Atomic Force Microscopy (AFM) ˆ Scanning Electron Microscopy (SEM) imaging, Infra Red ˆ Scanning Nearfield Optical Microscopy (IR-SNOM) or Electrical Micro-Nanprober systems.

The gold coated AdvancedTEC˙ is especially interesting for applications in the fields of Biology and Life Sciences like Force Spectroscopy, Binding Force Spectroscopy (Pull-off measurements) and chemical spectroscopy.

The general advantage of the AdvancedTEC is that this highly doped monolithic silicon probe is designed for precise positioning and high resolution imaging. It features a rectangular cantilever with a triangular free end and a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC˙ the only scanning probe in the world that offers real tip visibility through the optical system of the Atomic Force Microscope ˆ even when the probe is slightly tilted due to its mounting. This makes it the premium choice for all applications where the tip has to be visible (e.g. nanomanipulation). The AdvancedTEC˙ Tip is defined by real crystal planes which results in highly reproducible geometries and extremely smooth surfaces. Due to its very small half cone angles this new tip also shows great performance on samples that have a small pattern size combined with steep side walls.

The AdvancedTEC˙ is especially interesting for all applications where a direct optical access from top or from the side is necessary in order to be able to illuminate the AFM probe, the AFM tip or the sample simultaneously with the measurement with a laser, electron beam etc.

####

About NANOSENSORS
Since more than 15 years researchers world-wide rely on the guaranteed high quality of NANOSENSORS˙ probes for Atomic Force Microscopy and Scanning Probe Microscopy.

NANOSENSORS˙ AFM tips are mainly used in university research and commercial R&D labs where high resolution, consistent quality and reproducibility of results are essential.

NANOSENSORS˙ products are especially designed for the needs of scientists in the fields of nanotechnology, microtechnology, materials research, semiconductors, biology, biotechnology, chemistry and medicine.

For more information, please click here

Contacts:
Michaela Roessger
Phone: +41-32-720-5085

Copyright © NANOSENSORS

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Using ultrathin sheets to discover new class of wrapped shapes: UMass Amherst materials researchers describe a new regime of wrapped shapes August 31st, 2015

New material science research may advance tech tools August 31st, 2015

Efficiency of Nanodrug Containing Antibiotics in Treatment of Infectious Diseases Evaluated August 31st, 2015

Researchers use DNA 'clews' to shuttle CRISPR-Cas9 gene-editing tool into cells August 30th, 2015

Imaging

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

Kwansei Gakuin University in Hyogo, Japan, uses Raman microscopy to study crystallographic defects in silicon carbide wafers August 25th, 2015

Announcements

Using ultrathin sheets to discover new class of wrapped shapes: UMass Amherst materials researchers describe a new regime of wrapped shapes August 31st, 2015

An engineered surface unsticks sticky water droplets August 31st, 2015

New material science research may advance tech tools August 31st, 2015

Efficiency of Nanodrug Containing Antibiotics in Treatment of Infectious Diseases Evaluated August 31st, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic