Nanotechnology Now - Press Release: Hitachi's advanced HT7700 120kV TEM becomes more powerful!

Home > Press > Hitachi's advanced HT7700 120kV TEM becomes more powerful!

Abstract:
The introduction of the new objective lens option and a new STEM version makes Hitachi's HT7700 the most powerful 120 kV TEM currently available, as well as the most intuitive. Now the ground-breaking HT7700 is just as well suited to the low accelerating voltage, high resolution examination of engineered light element materials as the advanced biomedical and biological samples for which it is already known.

Hitachi's advanced HT7700 120kV TEM becomes more powerful!

Royston, UK | Posted on October 2nd, 2012

The new high resolution pole piece option for the HT7700 utilises Hitachi's unique double-gap objective lens technology, together with minimised spherical aberration to provide enhanced resolution - the best in class for a 120 kV instrument. This makes it especially suited to high resolution imaging of light element materials where lower voltages provide improved contrast and reduced damage. Exceptional imaging is possible even at voltages as low as 40 kV.

The HT7700 continues to offer fully digital imaging, with a wide range of fully integrated and semi integrated CCD camera systems to ensure that the best camera is available for the application. A high sensitivity real-time digital CCD camera enables all microscope operations to be performed through the graphical user interface - including setup, alignment, image adjustment and image acquisition.

An optional high performance Scanning Transmission Electron Microscope (STEM) system further enhances the analytical capabilities of the HT7700. This integrates seamlessly with HT7700 operation and provides powerful brightfield and darkfield imaging. The high magnification and large Field-Of-View STEM is ideal for high-resolution lattice imaging, bulk crystal structure, and nanoparticle analysis. With an intuitive STEM GUI and automation capabilities, spatially resolved EDX, analytical imaging and thick section analysis are all made routine. All STEM images are instantly archived in Hitachi's EMIP database software.

####

For more information, please click here

Contacts:
Press Enquiries:
In Press Public Relations Ltd
PO Box 24
Royston, Herts, SG8 6TT
Tel: +44 1763 262621

www.inpress.co.uk

Other Enquiries:

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark: