Home > News > Conference on Characterization and Metrology
March 14th, 2005
Conference on Characterization and Metrology
Abstract:
This conference will bring together scientists and engineers interested in all aspects of the technology and characterization techniques for silicon device research, development, manufacturing, and diagnostics: chemical and physical, electrical, optical, in-situ, and real-time control and monitoring. The conference is dedicated to summarizing major issues and giving critical reviews of important semiconductor techniques that are needed by the semiconductor industry as we move to silicon nanotechnology and beyond.
The conference provides a forum to present and discuss critical issues; problems and limits; evolving requirements and analysis needs; future directions; and key measurement principles, capabilities, applications, and limitations. The conference will consist of formal invited presentation sessions and poster sessions for contributed papers. The poster papers will cover new developments in characterization/metrology technology especially at the nano scale.
The 2005 International Conference on Characterization and Metrology for ULSI Technology is the fifth in a series. Richardson, Texas. March 15 - 18, 2005.
Source:
NIST
Bookmark:
| Related News Press |
Announcements
NRL charters Navy’s quantum inertial navigation path to reduce drift April 5th, 2024
Discovery points path to flash-like memory for storing qubits: Rice find could hasten development of nonvolatile quantum memory April 5th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||