Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics

Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.
Credit: M. Strus/NIST
Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.

Credit: M. Strus/NIST

Abstract:
Carbon nanotubes offer big promise in a small package. For instance, these tiny cylinders of carbon molecules theoretically can carry 1,000 times more electric current than a metal conductor of the same size. It's easy to imagine carbon nanotubes replacing copper wiring in future nanoscale electronics.

NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics

Boulder, CO | Posted on August 17th, 2011

But—not so fast. Recent tests at the National Institute of Standards and Technology (NIST) suggest device reliability is a major issue.

Copper wires transport power and other signals among all the parts of integrated circuits; even one failed conductor can cause chip failure. As a rough comparison, NIST researchers fabricated and tested numerous nanotube interconnects between metal electrodes. NIST test results, described at a conference this week,* show that nanotubes can sustain extremely high current densities (tens to hundreds of times larger than that in a typical semiconductor circuit) for several hours but slowly degrade under constant current. Of greater concern, the metal electrodes fail—the edges recede and clump—when currents rise above a certain threshold. The circuits failed in about 40 hours.

While many researchers around the world are studying nanotube fabrication and properties, the NIST work offers an early look at how these materials may behave in real electronic devices over the long term. To support industrial applications of these novel materials, NIST is developing measurement and test techniques and studying a variety of nanotube structures, zeroing in on what happens at the intersections of nanotubes and metals and between different nanotubes. "The common link is that we really need to study the interfaces," says Mark Strus, a NIST postdoctoral researcher.

In another, related study published recently,** NIST researchers identified failures in carbon nanotube networks—materials in which electrons physically hop from tube to tube. Failures in this case seemed to occur between nanotubes, the point of highest resistance, Strus says. By monitoring the starting resistance and initial stages of material degradation, researchers could predict whether resistance would degrade gradually—allowing operational limits to be set—or in a sporadic, unpredictable way that would undermine device performance. NIST developed electrical stress tests that link initial resistance to degradation rate, predictability of failure and total device lifetime. The test can be used to screen for proper fabrication and reliability of nanotube networks.

Despite the reliability concerns, Strus imagines that carbon nanotube networks may ultimately be very useful for some electronic applications. "For instance, carbon nanotube networks may not be the replacement for copper in logic or memory devices, but they may turn out to be interconnects for flexible electronic displays or photovoltaics," Strus says.

Overall, the NIST research will help qualify nanotube materials for next-generation electronics, and help process developers determine how well a structure may tolerate high electric current and adjust processing accordingly to optimize both performance and reliability.

* M.C. Strus, R.R. Keller and N. Barbosa III. Electrical reliability and breakdown mechanisms in single-walled carbon nanotubes. Paper presented at IEEE Nano 2011, Portland, Ore., Aug. 17, 2011.

** M.C. Strus, A.N. Chiaramonti, Y.L. Kim, Y.J. Jung and R.R. Keller. Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to dc electrical stressing. Nanotechnology 22 pp. 265713 (2011).

####

About NIST
The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

For more information, please click here

Contacts:
Laura Ost
303-497-4880

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Seeing the quantum future... literally: What if big data could help you see the future and prevent your mobile phone from breaking before it happened? January 16th, 2017

NUS researchers achieve major breakthrough in flexible electronics: New classes of printable electrically conducting polymer materials make better electrodes for plastic electronics and advanced semiconductor devices January 14th, 2017

Manchester scientists tie the tightest knot ever achieved January 13th, 2017

Nanoscale Modifications can be used to Engineer Electrical Contacts for Nanodevices January 13th, 2017

Chemistry on the edge: Experiments at Berkeley Lab confirm that structural defects at the periphery are key in catalyst function January 13th, 2017

Flexible Electronics

NUS researchers achieve major breakthrough in flexible electronics: New classes of printable electrically conducting polymer materials make better electrodes for plastic electronics and advanced semiconductor devices January 14th, 2017

Advance in intense pulsed light sintering opens door to improved electronics manufacturing December 23rd, 2016

Laboratories

Chemistry on the edge: Experiments at Berkeley Lab confirm that structural defects at the periphery are key in catalyst function January 13th, 2017

Recreating conditions inside stars with compact lasers: Scientists offer a new path to creating the extreme conditions found in stars, using ultra-short laser pulses irradiating nanowires January 12th, 2017

NIST physicists 'squeeze' light to cool microscopic drum below quantum limit January 12th, 2017

Govt.-Legislation/Regulation/Funding/Policy

Chemistry on the edge: Experiments at Berkeley Lab confirm that structural defects at the periphery are key in catalyst function January 13th, 2017

Recreating conditions inside stars with compact lasers: Scientists offer a new path to creating the extreme conditions found in stars, using ultra-short laser pulses irradiating nanowires January 12th, 2017

Deciphering the beetle exoskeleton with nanomechanics: Understanding exoskeletons could lead to new, improved artificial materials January 12th, 2017

New laser based on unusual physics phenomenon could improve telecommunications, computing January 12th, 2017

Chip Technology

Seeing the quantum future... literally: What if big data could help you see the future and prevent your mobile phone from breaking before it happened? January 16th, 2017

NUS researchers achieve major breakthrough in flexible electronics: New classes of printable electrically conducting polymer materials make better electrodes for plastic electronics and advanced semiconductor devices January 14th, 2017

Nanoscale Modifications can be used to Engineer Electrical Contacts for Nanodevices January 13th, 2017

New laser based on unusual physics phenomenon could improve telecommunications, computing January 12th, 2017

Memory Technology

Investigations of the skyrmion Hall effect reveal surprising results: One step further towards the application of skyrmions in spintronic devices December 28th, 2016

New material with ferroelectricity and ferromagnetism may lead to better computer memory December 21st, 2016

Characterization of magnetic nanovortices simplified December 21st, 2016

New technology of ultrahigh density optical storage researched at Kazan University: The ever-growing demand for storage devices stimulates scientists to find new ways of improving the performance of existing technologies November 30th, 2016

Nanotubes/Buckyballs/Fullerenes

Captured on video: DNA nanotubes build a bridge between 2 molecular posts: Research may lead to new lines of direct communication with cells January 9th, 2017

Nano-chimneys can cool circuits: Rice University scientists calculate tweaks to graphene would form phonon-friendly cones January 4th, 2017

WPI researchers build liquid biopsy chip that detects metastatic cancer cells in blood December 15th, 2016

Infrared instrumentation leader secures exclusive use of Vantablack coating December 5th, 2016

Announcements

Seeing the quantum future... literally: What if big data could help you see the future and prevent your mobile phone from breaking before it happened? January 16th, 2017

NUS researchers achieve major breakthrough in flexible electronics: New classes of printable electrically conducting polymer materials make better electrodes for plastic electronics and advanced semiconductor devices January 14th, 2017

Manchester scientists tie the tightest knot ever achieved January 13th, 2017

Nanoscale Modifications can be used to Engineer Electrical Contacts for Nanodevices January 13th, 2017

Energy

Stability challenge in perovskite solar cell technology: New research reveals intrinsic instability issues of iodine-containing perovskite solar cells December 26th, 2016

Nanoscale 'conversations' create complex, multi-layered structures: New technique leverages controlled interactions across surfaces to create self-assembled materials with unprecedented complexity December 22nd, 2016

Safe and inexpensive hydrogen production as a future energy source: Osaka University researchers develop efficient 'green' hydrogen production system that operates at room temperature in air December 21st, 2016

Going green with nanotechnology December 21st, 2016

Solar/Photovoltaic

Stability challenge in perovskite solar cell technology: New research reveals intrinsic instability issues of iodine-containing perovskite solar cells December 26th, 2016

Going green with nanotechnology December 21st, 2016

Research Study: MetaSOLTM Shatters Solar Panel Efficiency Forecasts with Innovative New Coating: Coating Provides 1.2 Percent Absolute Enhancement to Triple Junction Solar Cells December 2nd, 2016

Throwing new light on printed organic solar cells December 1st, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project