Nanotechnology Now





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics

Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.
Credit: M. Strus/NIST
Micrograph of recession and clumping in gold electrodes after NIST researchers applied 1.7 volts of electricity to the carbon nanotube wiring for an hour. The NIST reliability tests may help determine whether nanotubes can replace copper wiring in next-generation electronics.

Credit: M. Strus/NIST

Abstract:
Carbon nanotubes offer big promise in a small package. For instance, these tiny cylinders of carbon molecules theoretically can carry 1,000 times more electric current than a metal conductor of the same size. It's easy to imagine carbon nanotubes replacing copper wiring in future nanoscale electronics.

NIST Uncovers Reliability Issues for Carbon Nanotubes in Future Electronics

Boulder, CO | Posted on August 17th, 2011

But—not so fast. Recent tests at the National Institute of Standards and Technology (NIST) suggest device reliability is a major issue.

Copper wires transport power and other signals among all the parts of integrated circuits; even one failed conductor can cause chip failure. As a rough comparison, NIST researchers fabricated and tested numerous nanotube interconnects between metal electrodes. NIST test results, described at a conference this week,* show that nanotubes can sustain extremely high current densities (tens to hundreds of times larger than that in a typical semiconductor circuit) for several hours but slowly degrade under constant current. Of greater concern, the metal electrodes fail—the edges recede and clump—when currents rise above a certain threshold. The circuits failed in about 40 hours.

While many researchers around the world are studying nanotube fabrication and properties, the NIST work offers an early look at how these materials may behave in real electronic devices over the long term. To support industrial applications of these novel materials, NIST is developing measurement and test techniques and studying a variety of nanotube structures, zeroing in on what happens at the intersections of nanotubes and metals and between different nanotubes. "The common link is that we really need to study the interfaces," says Mark Strus, a NIST postdoctoral researcher.

In another, related study published recently,** NIST researchers identified failures in carbon nanotube networks—materials in which electrons physically hop from tube to tube. Failures in this case seemed to occur between nanotubes, the point of highest resistance, Strus says. By monitoring the starting resistance and initial stages of material degradation, researchers could predict whether resistance would degrade gradually—allowing operational limits to be set—or in a sporadic, unpredictable way that would undermine device performance. NIST developed electrical stress tests that link initial resistance to degradation rate, predictability of failure and total device lifetime. The test can be used to screen for proper fabrication and reliability of nanotube networks.

Despite the reliability concerns, Strus imagines that carbon nanotube networks may ultimately be very useful for some electronic applications. "For instance, carbon nanotube networks may not be the replacement for copper in logic or memory devices, but they may turn out to be interconnects for flexible electronic displays or photovoltaics," Strus says.

Overall, the NIST research will help qualify nanotube materials for next-generation electronics, and help process developers determine how well a structure may tolerate high electric current and adjust processing accordingly to optimize both performance and reliability.

* M.C. Strus, R.R. Keller and N. Barbosa III. Electrical reliability and breakdown mechanisms in single-walled carbon nanotubes. Paper presented at IEEE Nano 2011, Portland, Ore., Aug. 17, 2011.

** M.C. Strus, A.N. Chiaramonti, Y.L. Kim, Y.J. Jung and R.R. Keller. Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to dc electrical stressing. Nanotechnology 22 pp. 265713 (2011).

####

About NIST
The National Institute of Standards and Technology (NIST) is an agency of the U.S. Department of Commerce.

For more information, please click here

Contacts:
Laura Ost
303-497-4880

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Conversion of Greenhouse Gases to Syngas in Presence of Nanocatalysts in Iran May 22nd, 2015

New Antibacterial Wound Dressing in Iran Can Display Replacement Time May 22nd, 2015

Haydale Named Lead Sponsor for Cambridge Graphene Festival May 22nd, 2015

Simulations predict flat liquid May 21st, 2015

Laboratories

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Defects can 'Hulk-up' materials: Berkeley lab study shows properly managed damage can boost material thermoelectric performances May 20th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

CLAIRE brings electron microscopy to soft materials: Berkeley researchers develop breakthrough technique for noninvasive nanoscale imaging May 14th, 2015

Argonne chooses Beneq’s TFS 500 Atomic Layer Deposition System: Modularity and flexibility make for a natural choice May 14th, 2015

Flexible Electronics

Toward 'green' paper-thin, flexible electronics May 20th, 2015

Govt.-Legislation/Regulation/Funding/Policy

Nanotherapy effective in mice with multiple myeloma May 21st, 2015

Turn that defect upside down: Twin boundaries in lithium-ion batteries May 21st, 2015

INSIDDE: Uncovering the real history of art using a graphene scanner May 21st, 2015

SUNY Poly CNSE and NIOSH Launch Federal Nano Health and Safety Consortium: May 20th, 2015

Chip Technology

Nanometrics Announces Live Webcast of Upcoming Investor and Analyst Day May 20th, 2015

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Defects can 'Hulk-up' materials: Berkeley lab study shows properly managed damage can boost material thermoelectric performances May 20th, 2015

GLOBALFOUNDRIES Offers New Low-Power 28nm Solution for High-Performance Mobile and IoT Applications: Technology is the first in the industry to provide design enablement support optimized to meet low power requirements of RF SoCs May 20th, 2015

Memory Technology

Nano memory cell can mimic the brain’s long-term memory May 14th, 2015

Silicon Storage Technology and GLOBALFOUNDRIES Announce Qualification of Automotive Grade 55nm Embedded Flash Memory Technology May 5th, 2015

Heat makes electrons’ spin in magnetic superconductors April 26th, 2015

Northwestern scientists develop first liquid nanolaser: Technology could lead to new way of doing 'lab on a chip' medical diagnostics April 25th, 2015

Nanotubes/Buckyballs/Fullerenes

Researchers develop new way to manufacture nanofibers May 21st, 2015

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Cotton fibres instead of carbon nanotubes May 9th, 2015

A better way to build DNA scaffolds: McGill researchers devise new technique to produce long, custom-designed DNA strands May 6th, 2015

Announcements

Conversion of Greenhouse Gases to Syngas in Presence of Nanocatalysts in Iran May 22nd, 2015

New Antibacterial Wound Dressing in Iran Can Display Replacement Time May 22nd, 2015

Haydale Named Lead Sponsor for Cambridge Graphene Festival May 22nd, 2015

INSIDDE: Uncovering the real history of art using a graphene scanner May 21st, 2015

Energy

Conversion of Greenhouse Gases to Syngas in Presence of Nanocatalysts in Iran May 22nd, 2015

Sandia researchers first to measure thermoelectric behavior by 'Tinkertoy' materials May 20th, 2015

Industrial Nanotech, Inc. Announces Official Launch of the Eagle Platinum Tile™ May 19th, 2015

FEI and Weatherford Enter Into Joint Agreement for Advanced Reservoir Characterization Services May 18th, 2015

Solar/Photovoltaic

Efficiency record for black silicon solar cells jumps to 22.1 percent: Aalto University's researchers improved their previous record by over 3 absolute percents in cooperation with Universitat Politècnica de Catalunya May 18th, 2015

Wearables may get boost from boron-infused graphene: Rice U. researchers flex muscle of laser-written microsupercapacitors May 18th, 2015

Random nanowire configurations increase conductivity over heavily ordered configurations May 16th, 2015

ORNL demonstrates first large-scale graphene fabrication May 14th, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project