Nanotechnology Now

Our NanoNews Digest Sponsors


Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > CNST Researchers Develop Integrated Nanomechanical Sensor for Atomic Force Microscopy



Scanning electron micrograph of the cantilever-microdisksystem.
The image has a calculated z-component of the magnetic
field overlaid on the structure.
Scanning electron micrograph of the cantilever-microdisksystem. The image has a calculated z-component of the magnetic field overlaid on the structure.

Abstract:
The atomic force microscope (AFM) is an important tool for nanoscale surface metrology. Typical AFMs map local tip-surface interactions by scanning a flexible cantilever probe over a surface. They rely on bulky optical sensing instrumentation to measure the motion of the probe, which limits the sensitivity, stability, and accuracy of the microscope, and precludes the use of probes much smaller than the wavelength of light. As reported in Nano Letters,* CNST researchers have fabricated a novel integrated sensor combining a nanomechanical cantilever probe with a high sensitivity nanophotonic interferometer on a single silicon chip. Replacing the bulky laser detection system allowed them to build cantilevers orders of magnitude smaller than those used in conventional AFMs.

CNST Researchers Develop Integrated Nanomechanical Sensor for Atomic Force Microscopy

Gaithersburg, MD | Posted on June 6th, 2011

Because each of these smaller structures has an effective mass less than a picogram, the detection bandwidth is dramatically increased, reducing the system response time to a few hundred nanoseconds. While probe stiffness was kept comparable to conventional microcantilevers in order to maintain high mechanical gain (how much the tip moves when it senses a force change), the probe size was reduced to a mere 25 m in length, 260 nm in thickness, and only 65 nm in width. Readout is based on "cavity optomechanics", with the probe fabricated adjacent to a microdisk optical cavity at a gap of less than 100 nm. Due to this close separation, light circulating within the cavity is strongly influenced by the motion of the probe tip. The cavity has a high optical quality factor (Q), meaning that the light makes tens of thousands of round-trips inside the cavity before leaking out of it, all the time accumulating information about the probe's position. The combination of small probe-cavity separation and high Q gives the device sensitivity to probe motion at less than 1 fm/√Hz, while the cavity is able to sense changes in probe position with high bandwidth. The entire device is nanofabricated as a single, monolithic unit on a silicon wafer. It is therefore compact (chip-scale), self-aligned, and stable. Fiber optic waveguides couple light into and out of the sensor, so that it can be easily interfaced with standard optical sources and detectors. Finally, through simple changes to the probe geometry, the mechanics of the probe tip can be greatly varied, allowing for the different combinations of mechanical gain and bandwidth needed for a variety of AFM applications.

*Optomechanical transduction of an integrated silicon cantilever probe using a microdisk resonator, K. Srinivasan, H. Miao, M.T. Rakher, M. Davanco, and V. Aksyuk, Nano Letters 11, 791-797 (2011).

####

About National Institute of Standards and Technology (NIST)
Founded in 1901, NIST is a non-regulatory federal agency within the U.S. Department of Commerce. NIST's mission is to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.

For more information, please click here

Contacts:
Kartik Srinivasan
301-975-5938

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Imaging

Oxford Instruments Asylum Research and McGill University Announce the McGill AFM Summer School and Workshop, May 12-13, 2016 May 4th, 2016

The intermediates in a chemical reaction photographed 'red-handed' Researchers at the UPV/EHU-University of the Basque Country have for the first time succeeded in imaging all the steps in a complex organic reaction and have resolved the mechanisms that explain it May 4th, 2016

New tool allows scientists to visualize 'nanoscale' processes May 4th, 2016

News and information

Oxford Instruments Asylum Research and McGill University Announce the McGill AFM Summer School and Workshop, May 12-13, 2016 May 4th, 2016

The intermediates in a chemical reaction photographed 'red-handed' Researchers at the UPV/EHU-University of the Basque Country have for the first time succeeded in imaging all the steps in a complex organic reaction and have resolved the mechanisms that explain it May 4th, 2016

Laboratories

Exploring phosphorene, a promising new material April 29th, 2016

NREL finds nanotube semiconductors well-suited for PV systems April 27th, 2016

NREL theory establishes a path to high-performance 2-D semiconductor devices April 27th, 2016

Brookhaven's Oleg Gang Named a Battelle 'Inventor of the Year': Recognized for work using DNA to guide and regulate the self-assembly of nanoparticles into clusters and arrays with controllable properties April 25th, 2016

Govt.-Legislation/Regulation/Funding/Policy

New tool allows scientists to visualize 'nanoscale' processes May 4th, 2016

A compact, efficient single photon source that operates at ambient temperatures on a chip: Highly directional single photon source concept is expected to lead to a significant progress in producing compact, cheap, and efficient sources of quantum information bits for future appls May 3rd, 2016

Little ANTs: Researchers build the world's tiniest engine May 3rd, 2016

An Experiment Seeks to Make Quantum Physics Visible to the Naked Eye May 3rd, 2016

Discoveries

The intermediates in a chemical reaction photographed 'red-handed' Researchers at the UPV/EHU-University of the Basque Country have for the first time succeeded in imaging all the steps in a complex organic reaction and have resolved the mechanisms that explain it May 4th, 2016

New tool allows scientists to visualize 'nanoscale' processes May 4th, 2016

A compact, efficient single photon source that operates at ambient temperatures on a chip: Highly directional single photon source concept is expected to lead to a significant progress in producing compact, cheap, and efficient sources of quantum information bits for future appls May 3rd, 2016

Nuclear pores captured on film: Using an ultra fast-scanning atomic force microscope, researchers from the University of Basel have filmed 'living' nuclear pore complexes at work for the first time May 3rd, 2016

Announcements

Oxford Instruments Asylum Research and McGill University Announce the McGill AFM Summer School and Workshop, May 12-13, 2016 May 4th, 2016

The intermediates in a chemical reaction photographed 'red-handed' Researchers at the UPV/EHU-University of the Basque Country have for the first time succeeded in imaging all the steps in a complex organic reaction and have resolved the mechanisms that explain it May 4th, 2016

New tool allows scientists to visualize 'nanoscale' processes May 4th, 2016

FEI Launches Apreo Industry-Leading Versatile, High-Performance SEM: The Apreo SEM provides high-resolution surface information with excellent contrast, and the flexibility to accommodate a large range of samples, applications and conditions May 4th, 2016

Tools

Oxford Instruments Asylum Research and McGill University Announce the McGill AFM Summer School and Workshop, May 12-13, 2016 May 4th, 2016

The intermediates in a chemical reaction photographed 'red-handed' Researchers at the UPV/EHU-University of the Basque Country have for the first time succeeded in imaging all the steps in a complex organic reaction and have resolved the mechanisms that explain it May 4th, 2016

New tool allows scientists to visualize 'nanoscale' processes May 4th, 2016

FEI Launches Apreo Industry-Leading Versatile, High-Performance SEM: The Apreo SEM provides high-resolution surface information with excellent contrast, and the flexibility to accommodate a large range of samples, applications and conditions May 4th, 2016

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic