Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Seeing an atomic thickness

The left hand image is the topography; the middle the topography error image; and right the electrostatic force microscopy image where the tip bias has been switched half way through the image.
The left hand image is the topography; the middle the topography error image; and right the electrostatic force microscopy image where the tip bias has been switched half way through the image.

Abstract:
Scientists from NPL, in collaboration with Linköping University, Sweden, have shown that regions of graphene of different thickness can be easily identified in ambient conditions using Electrostatic Force Microscopy (EFM).

Seeing an atomic thickness

UK and Sweden | Posted on May 21st, 2011

The exciting properties of graphene are usually only applicable to the material that consists of one or two layers of the graphene sheets. Whilst synthesis of any number of layers is possible, the thicker layers have properties closer to the more common bulk graphite.

For device applications one- and two-layer graphene needs to be precisely identified apart from the substrate and regions of thicker graphene. Exfoliated graphene sheets up to ~100 μm in size can be routinely identified by optical microscopy. However, the situation is much more complicated in the case of the epitaxial graphene grown on silicon carbide wafers with a diameter up to 5 inches where the straightforward identification of the graphene thickness is difficult using standard techniques. This research shows that EFM, which is one of the most widely accessible and simplest implementations of scanning probe microscopy, can clearly identify different graphene thicknesses. The technique can also be used in ambient environments applicable to industrial requirements.

This work was recently published in Nano Letters.

####

About NPL
The National Physical Laboratory (NPL) is one of the UK's leading science and research facilities. It is a world-leading centre of excellence in developing and applying the most accurate standards, science and technology available.

NPL occupies a unique position as the UK's National Measurement Institute and sits at the intersection between scientific discovery and real world application. Its expertise and original research have underpinned quality of life, innovation and competitiveness for UK citizens and business for more than a century:

• NPL provides companies with access to world-leading support and technical expertise, inspiring the absolute confidence required to realise competitive advantage from new materials, techniques and technologies;

• NPL expertise and services are crucial in a wide range of social applications - helping to save lives, protect the environment and enable citizens to feel safe and secure. Support in areas such as the development of advanced medical treatments and environmental monitoring helps secure a better quality of life for all;

• NPL develops and maintains the nation’s primary measurement standards, supporting an infrastructure of traceable measurement throughout the UK and the world, to ensure accuracy and consistency.

For more information, please click here

Contacts:
Dr Tim Burnett
Team Materials
Email
Phone +44 20 8943 8661

Dr Olga Kazakova
Team Time Quantum and Electromagnetics
Email
Phone +44 20 8943 6143

Copyright © NPL

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related Links

Find out more about NPL's Functional Materials research.

Find out more about NPL's research into Quantum Phenomena.

Related News Press

News and information

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

National Space Society Welcomes Janet Ivey As New NSS Governor: Janet Ivey of Janet's Planet is NOW IN ORBIT as a member of the Board of Governors of the National Space Society August 27th, 2015

Graphene

Successful boron-doping of graphene nanoribbon August 27th, 2015

Imaging

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Discoveries

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

CWRU researchers efficiently charge a lithium-ion battery with solar cell: Coupling with perovskite solar cell holds potential for cleaner cars and more August 27th, 2015

Successful boron-doping of graphene nanoribbon August 27th, 2015

Announcements

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic