Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Veeco Introduces Dimension Edge Atomic Force Microscope System

Abstract:
Streamlined Access to Top AFM Performance

Veeco Introduces Dimension Edge Atomic Force Microscope System

Plainview, NY | Posted on March 10th, 2010

Veeco Instruments Inc. (VECO 37.42, +1.17, +3.23%), the leading provider of atomic force microscopy technology to the nanoscience community, announced today the Dimension(R) Edge(TM) Atomic Force Microscope (AFM) System for physical and life sciences investigation. This latest offering follows five major AFM releases from Veeco in 2009 alone, and offers the best-in-class performance of the Dimension Icon(R) in a simplified package with a compact footprint. Nanoscale researchers now can utilize the top levels of AFM capability at lower system costs and with streamlined operation.

"We continue to develop and release revolutionary new AFM products, modes and system improvements aimed at enabling our customers to push scientific boundaries and set new standards in their work," said David Rossi, Vice President and General Manager of Veeco's AFM Business. "We also want to break down the cost and productivity barriers facing today's researchers. With the Dimension Edge, Veeco again shows its dedication to making nanoscale materials and device characterization accessible to every facility and user."

To the extent that this news release discusses expectations or otherwise makes statements about the future, such statements are forward-looking and are subject to a number of risks and uncertainties that could cause actual results to differ materially from the statements made. These factors include the risks discussed in the Business Description and Management's Discussion and Analysis sections of Veeco's Annual Report on Form 10-K for the year ended December 31, 2009 and in our subsequent quarterly reports on Form 10-Q, current reports on Form 8-K and press releases. Veeco does not undertake any obligation to update any forward-looking statements to reflect future events or circumstances after the date of such statements.

####

About Veeco Instruments Inc.
Veeco Instruments Inc. manufactures enabling solutions for customers in the HB-LED, solar, data storage, semiconductor, scientific research and industrial markets. We have leading technology positions in our three businesses: LED & Solar Process Equipment, Data Storage Process Equipment, and Metrology Instruments. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona, Minnesota and Massachusetts. Global sales and service offices are located throughout the U.S., Europe, Japan and APAC. For more information, visit www.veeco.com.

About Dimension Edge
The mid-priced Dimension Edge AFM features hardware and software advances that reduce the time required to produce expert-level data, providing a seamless path from sample placement through optical identification of the region of interest, and from AFM survey mode to zoomed-in feature identification. The system's proprietary closed-loop and drift-compensated stage allow the productivity, accuracy, and sample versatility advantages of a large-sample, closed-loop system to be combined with the acquisition of high-resolution images traditionally only achieved by small-sample, open-loop systems. With lower noise levels, the Dimension Edge AFM system permits collection of the finer details critical to proper material identification, while protecting fragile tips and samples, and diminishing tip artifacts.

This core performance, along with a wide offering of AFM modes, give the Dimension Edge the exceptionally accurate imaging and single-point spectroscopy capabilities required for many applications, including the characterization of solar and semiconductor devices, the mapping of heterogeneous polymer-based materials, interrogation of individual nanoparticles, and in situ imaging of life science samples from single molecules to whole cells.

For more information, please click here

Contacts:
Veeco Instruments Inc.
Financial:
Debra Wasser, SVP Investor Relations & Corp. Comm.
516-677-0200 x 1472
or
Trade:
Milka Pejovic, Marketing Communications Manager
805-967-2700 x 2412

Copyright © Business Wire

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Phagraphene, a 'relative' of graphene, discovered September 2nd, 2015

A marine creature's magic trick explained: Crystal structures on the sea sapphire's back appear differently depending on the angle of reflection September 2nd, 2015

National Science Foundation Selects SUNY Poly CNSE for Expanded $2.1M Northeast Advanced Technological Education Center: NSF Center Locates to NanoCollege in Support of Flourishing Tech Industry in NYS September 1st, 2015

RUSNANOPRIZE Directorate Announces New Deadline for Nominations Submission – September 11, 2015 September 1st, 2015

Announcements

Phagraphene, a 'relative' of graphene, discovered September 2nd, 2015

A marine creature's magic trick explained: Crystal structures on the sea sapphire's back appear differently depending on the angle of reflection September 2nd, 2015

Waste coffee used as fuel storage: Scientists have developed a simple process to treat waste coffee grounds to allow them to store methane September 2nd, 2015

Nanotech could rid cattle of ticks, with less collateral damage September 1st, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic