Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > SII NanoTechnology USA Inc. Designs and Assembles Innovative Silicon Drift Detector

Abstract:
Leading X-ray and XRF Equipment Developer Improves X-ray Detectors Used in X-ray Spectrometry and Electron Microscopy

SII NanoTechnology USA Inc. Designs and Assembles Innovative Silicon Drift Detector

Northridge, CA | Posted on February 28th, 2010

SII NanoTechnology Inc. (SIINT) recently created a custom silicon drift detector (SDD) with a larger solid angle for use in nanotechnology characterization. The solid angle was improved by a factor of 20, resulting in significant improvement in the overall count rate capability.

"We are constantly striving to improve our SDD products," says Gordon Myers, SIINT Vice President of Sales and Marketing. "SII NanoTechnology is committed researching nanotechnology and developing X-ray and XRF solutions that are straightforward, inventive and cost-saving."

The characterization of nanoscale materials at high spatial resolution has become increasingly important in state-of-the-art materials research. Instruments such as Argonne National Laboratory's (ANL) sub-angstrom electron-optical instrument and the X-ray Nanoprobe are capable of extraordinary spatial resolution to study these materials.

SII NanoTechnology USA Inc. customized a 50 mm2 SDD with a larger solid angle, designing and assembling into a scanning electron microscope (SEM) at the Electron Microscopy Center at ANL. Compared to a traditional 50 mm2 Si(Li) detector, the new large solid angle SDD spectrometer increased throughput with excellent energy resolution at short peaking times.

"SII NanoTechnology is proud to be an industry leader in scientific instrument development," states Myers. "We will continue explore nanotechnology and look forward to developing more equipment for applications such as x-ray spectroscopy and x-ray fluorescence measurements."

####

About SII NanoTechnology
SII NanoTechnology USA Inc. (www.siintusa.com) is the world's leading instrument development company, dedicated to the research, development and commercialization of X-ray detectors and spectrometric systems. From research and design, to superior after-sales support, SII NanoTechnology continues to push the boundaries of nanotechnology to bring simple, innovative and cost-saving X-ray and XRF solutions to the world.

For more information, please click here

Contacts:
SII NanoTechnology USA Inc.
19865 Nordhoff Street
Northridge, CA 91324
(818) 280-0745
(818) 280-0408 FAX

Gordon Myers
Vice President, Sales and Marketing
Detectors and XRF Systems

Ext. 112

Copyright © SII NanoTechnology

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Researchers printed graphene-like materials with inkjet August 17th, 2017

Candy cane supercapacitor could enable fast charging of mobile phones August 17th, 2017

Freeze-dried foam soaks up carbon dioxide: Rice University scientists lead effort to make novel 3-D material August 16th, 2017

Gold shines through properties of nano biosensors: Researchers discover that fluorescence in ligand-protected gold nanoclusters is an intrinsic property of the gold particles themselves August 16th, 2017

Announcements

Researchers printed graphene-like materials with inkjet August 17th, 2017

Candy cane supercapacitor could enable fast charging of mobile phones August 17th, 2017

Freeze-dried foam soaks up carbon dioxide: Rice University scientists lead effort to make novel 3-D material August 16th, 2017

Gold shines through properties of nano biosensors: Researchers discover that fluorescence in ligand-protected gold nanoclusters is an intrinsic property of the gold particles themselves August 16th, 2017

Tools

Scientists from the University of Manchester and Diamond Light Source work with Deben to develop and test a new compression stage to study irradiated graphite at elevated temperatures August 15th, 2017

FRITSCH • Milling and Sizing! Innovations at POWTECH 2017 - Hall 2 • Stand 227 August 9th, 2017

New Quattro Field Emission ESEM Emphasizes Versatility and Ease of Use: Thermo Scientific Quattro ESEM allows materials science researchers to study nanoscale structure in almost any material under a range of environmental conditions August 8th, 2017

Thermo Fisher Scientific’s New Talos F200i S/TEM Delivers Flexible, High-Performance Imaging: New compact S/TEM can be configured to meet specific imaging and analytical requirements for materials characterization in research laboratories August 8th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project