Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Nanometrics Receives Multiple System Orders for High-Brightness LED Metrology

Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, today announced orders for one VerteX™ and multiple RPMBlue™ photoluminescence (PL) mapping metrology systems. The VerteX system is expected to be qualified into a new HB-LED development line, and the RPMBlue systems are expected to be qualified into the high-volume manufacturing line of a different customer. All systems are expected to be qualified in the third quarter of this year.

Nanometrics Receives Multiple System Orders for High-Brightness LED Metrology

Milpitas, CA | Posted on July 8th, 2009

Our customers are leveraging the increased capability of the VerteX system to address challenges in the rapidly-growing HB-LED market. New end-device deployments in area lighting, LCD back-lighting and an increased understanding of the performance and cost-of-ownership benefits of high-brightness LEDs are driving HB-LED development," commented Tom Ryan, Director of the Materials Characterization Business Unit at Nanometrics. "Our PL mapping products are well-positioned to support increased development and rapid production ramps as new high-brightness LED manufacturing technologies come online."

The VerteX PL mapping system provides a combination of metrology technologies to support both process development and production control. The VerteX is capable of supporting epitaxial layer metrology on many substrate types and sizes and, due to the illumination system options, can cover the entire spectrum of LED technologies from UV-LEDs through the visible colors to infra-red. Nanometrics' newest product for HB-LED process control is the RPMBlue. This is targeted at production control of Gallium Nitride (GaN)-based blue HB-LEDs that are increasingly used in LCD back-lighting. The system has been optimized for industry-leading throughput of up to 80 two-inch GaN wafers per hour. Because of the available features and performance, Nanometrics believes its PL mapping systems are used by over 90% of the top-tier HB-LED manufacturers in development and production.

Forward Looking Statements
This press release contains forward-looking statements including, but not limited to, statements regarding the expected shipment and qualification of multiple HB-LED metrology systems, the capabilities of Nanometrics' metrology systems and the company's market position in the HB-LED market. For additional information and considerations regarding the risks faced by Nanometrics, see its annual report on Form 10-K for the year ended December 27, 2008 as filed with the Securities and Exchange Commission, as well as other periodic reports filed with the SEC from time to time. Although Nanometrics believes that the expectations reflected in the forward-looking statements are reasonable, Nanometrics cannot guarantee future results, levels of activity, performance or achievements. Nanometrics disclaims any obligation to update information contained in any forward-looking statement.

####

About Nanometrics
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control, topography, and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process, from front end of line substrate manufacturing through die preparation for packaging. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Nanometrics Contact:
Kevin Heidrich
408.545.6000 tel, 408.317.1346 fax


Investor Relations:
Claire McAdams
Headgate Partners LLC
530-265-9899 tel; 530-265-9699 fax

Copyright © Nanometrics

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

A new, tunable device for spintronics: An international team of scientists including physicist Jairo Sinova from the University of Mainz realises a tunable spin-charge converter made of GaAs August 29th, 2014

Nanoscale assembly line August 29th, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Chip Technology

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

Fonon Announces 3D Metal Sintering Technology: Emerging Additive Nano Powder Manufacturing Technology August 28th, 2014

RMIT delivers $30m boost to micro and nano-tech August 26th, 2014

Competition for Graphene: Berkeley Lab Researchers Demonstrate Ultrafast Charge Transfer in New Family of 2D Semiconductors August 26th, 2014

Announcements

A new, tunable device for spintronics: An international team of scientists including physicist Jairo Sinova from the University of Mainz realises a tunable spin-charge converter made of GaAs August 29th, 2014

Nanoscale assembly line August 29th, 2014

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

New Vice President Takes Helm at CNSE CMOST: Catherine Gilbert To Lead CNSE Children’s Museum of Science and Technology Through Expansion And Relocation August 29th, 2014

Tools

New analytical technology reveals 'nanomechanical' surface traits August 29th, 2014

Ultra-Low Frequency Vibration Isolation Stabilizes Scanning Tunneling Microscopy at UCLA’s Nano-Research Group August 28th, 2014

Measure Both Elastic and Viscous Properties with AFM Using Asylum Research’s Exclusive AM-FM Viscoelastic Mapping Mode August 28th, 2014

Malvern specialists to deliver inaugural short course on polymer characterization at Interplas 2014 August 27th, 2014

Solar/Photovoltaic

Novel 'butterfly' molecule could build new sensors, photoenergy conversion devices August 28th, 2014

Competition for Graphene: Berkeley Lab Researchers Demonstrate Ultrafast Charge Transfer in New Family of 2D Semiconductors August 26th, 2014

Eco-friendly 'pre-fab nanoparticles' could revolutionize nano manufacturing: UMass Amherst team invents a way to create versatile, water-soluble nano-modules August 13th, 2014

An Inkjet-Printed Field-Effect Transistor for Label-Free Biosensing August 11th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE