Nanotechnology Now

Our NanoNews Digest Sponsors



Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > FRT Presents New Affordable Optical Tool for Non-Contact Film Thickness Measurements - Introduction at Laser 2009 in Munich

Abstract:
FRT presents a new affordable optical film thickness tool at this year's Laser 2009 in Munich. The measuring system is used for non-contact film thickness measurements in 2D and 3D with very high resolution.

FRT Presents New Affordable Optical Tool for Non-Contact Film Thickness Measurements - Introduction at Laser 2009 in Munich

Bergisch Galdbach, Germany | Posted on June 8th, 2009

FRT presents a new optical film thickness measuring tool at this year's Laser 2009 in Munich (visit: http://www.film-thickness.com). The new MicroSpy FT non-destructively measures coatings that transparent or semi-transparent in the visible and near-infrared spectrum of light.

The easy to use film thickness measuring tool is cost-effective and powerful at the same time. With its innovative 3D film thickness mapping mode, the tool allows the thickness measurement of entire coating areas to visualize and evaluate the evenness of film thickness distribution as well as classical point and profile measurements on the coating. Furthermore, self-supported films such as foils, single films or stacked films on a substrate can be characterized. The tool is used in research and quality control of innovative products in the fields of medical-, semiconductor- and microsystem technology (MST) as well as in photovoltaics, optics and the automotive industry.

According to the given measurement task, the new FRT MicroSpy FT is equipped with a fast interferometric or reflectometric film thickness sensor. A selection of nine different sensor types with various light sources, measuring spot sizes and thickness measuring ranges offer great flexibility for the measurement of all kinds of coating materials and coating thicknesses from a few millimeters down to 10 nanometers.

The new tool is very easy to use with minimum training required. Its integrated CCD-camera with illumination provides a live camera picture of the measuring area directly in the software. Sample positioning is done with the click of a mouse button through a motorized precision table with a travel range of 50 mm x 50 mm. To put the sensor in perfect focus, FRT has included a high-precision z-axis with micrometer resolution that is usually found in only the very highest quality optical microscopes.

To find out more about the new film thickness measuring tool MicroSpy FT, visit FRT at this year's Laser 2009 in hall B2, booth 443!

####

About FRT GmbH
For 14 years, Fries Research & Technology GmbH (FRT) has been a trusted partner for industry-proven metrological surface measuring systems. The tools are used for the non-destructive investigation of film thickness, topography, profile, roughness and other parameters. More than 300 international companies such as Q-Cells, Wacker Schott Solar, Bayer, Bosch, Daimler or Infineon equip their R&D and production with FRT metrology systems. FRT operates from Bergisch Gladbach, Germany and maintains subsidiaries in China, Switzerland and the United States.

For more information, please click here

Contacts:
Dr. Oliver Schillings
Phone.: +49(0)2202-9590-01

Copyright © FRT GmbH

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Chip Technology

Instant-start computers possible with new breakthrough December 19th, 2014

Switching to spintronics: Berkeley Lab reports on electric field switching of ferromagnetism at room temp December 17th, 2014

Pb islands in a sea of graphene magnetise the material of the future December 16th, 2014

Stanford team combines logic, memory to build a 'high-rise' chip: Today circuit cards are laid out like single-story towns; Futuristic architecture builds layers of logic and memory into skyscraper chips that would be smaller, faster, cheaper -- and taller December 15th, 2014

Nanomedicine

Enzyme Biosensor Used for Rapid Measurement of Drug December 22nd, 2014

Creation of 'Rocker' protein opens way for new smart molecules in medicine, other fields December 18th, 2014

Iranian Researchers Produce Electrical Pieces Usable in Human Body December 18th, 2014

Zenosense, Inc. - Hospital Collaboration - 400 Person Lung Cancer Detection Trial December 17th, 2014

Nanoelectronics

Stacking two-dimensional materials may lower cost of semiconductor devices December 11th, 2014

Defects are perfect in laser-induced graphene: Rice University lab discovers simple way to make material for energy storage, electronics December 10th, 2014

Nanoscale resistors for quantum devices: The electrical characteristics of new thin-film chromium oxide resistors that can be tuned by controlling the oxygen content detailed in the 'Journal of Applied Physics' December 9th, 2014

'Giant' charge density disturbances discovered in nanomaterials: Juelich researchers amplify Friedel oscillations in thin metallic films November 26th, 2014

Announcements

Piezoelectricity in a 2-D semiconductor: Berkeley Lab researchers discovery of piezoelectricty in molybdenum disulfide holds promise for future MEMS December 22nd, 2014

Quantum physics just got less complicated December 22nd, 2014

Enzyme Biosensor Used for Rapid Measurement of Drug December 22nd, 2014

Universality of charge order in cuprate superconductors: Charge order has been established in another class of cuprate superconductors, highlighting the importance of the phenomenon as a general property of these high-Tc materials December 22nd, 2014

Tools

Atom-thick CCD could capture images: Rice University scientists develop two-dimensional, light-sensitive material December 20th, 2014

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Switching to spintronics: Berkeley Lab reports on electric field switching of ferromagnetism at room temp December 17th, 2014

ORNL microscopy pencils patterns in polymers at the nanoscale December 17th, 2014

Automotive/Transportation

Lifeboat Foundation gives 2014 Guardian Award to Elon Musk December 16th, 2014

The gold standard December 9th, 2014

Nanocatalysts Can Reduce Pollution Caused by Diesel Engines December 4th, 2014

NEI introduces NANOMYTEŽ SuperAi, a Durable Anti-ice Coating December 4th, 2014

Nanobiotechnology

Scientists trace nanoparticles from plants to caterpillars: Rice University study examines how nanoparticles behave in food chain December 16th, 2014

FEI and Oregon Health & Science University Install a Complete Correlative Microscopy Workflow in Newly Built Collaborative Science Facility December 16th, 2014

UCLA engineers first to detect and measure individual DNA molecules using smartphone microscope December 15th, 2014

Biomimetic dew harvesters: Understanding how a desert beetle harvests water from dew could improve drinking water collection in dew condensers December 8th, 2014

Solar/Photovoltaic

Oregon researchers glimpse pathway of sunlight to electricity: Collaboration with Lund University uses modified UO spectroscopy equipment to study 'maze' of connections in photoactive quantum dots December 19th, 2014

Lifeboat Foundation gives 2014 Guardian Award to Elon Musk December 16th, 2014

Stacking two-dimensional materials may lower cost of semiconductor devices December 11th, 2014

New Technique Could Harvest More of the Sun's Energy December 9th, 2014

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE