Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > ESI Introduces the Model 6680 Ceramic Component Visual Test System

Abstract:
Electro Scientific Industries, Inc. (NASDAQ:ESIO), a leading provider of world-class photonic and laser systems for microengineering applications, today introduced its Model 6680 Visual Test System for two- and three-dimension inspection of ceramic components. ESI's 6680 system extends the strengths of its Model 6650A to provide twice the throughput, combined with industry-leading yield. The system also offers 30-percent higher resolution for side inspection and 200-percent higher resolution for end inspection of surface-mount MLCC, MLCI and MLCV chips. The first 6680 system has been purchased and is being used in production at one of ESI's customer sites located in Japan.

ESI Introduces the Model 6680 Ceramic Component Visual Test System

Portland, OR | Posted on April 29th, 2009

Superior inspection and accurate sorting of acceptable chips from defective chips is critical in the production of ceramic components. Due to its remarkably increased throughput, precision and flexibility, the Model 6680 is ideally suited for production inspection in a manufacturing environment that demands uncompromised performance and low cost-of-ownership.

"The 6680 system builds on the success of the 6650A tool and is designed to enable our customers' evolving product roadmaps," noted Vernon Cooke, ESI passive components product marketing manager. "Our strong customer relationships allow us to better understand their manufacturing challenges and changing requirements. As a result, we developed the 6680 system with twice the throughput over the previous generation tool. The system also offers significantly higher resolution and performance capabilities to provide unprecedented yield and cost advantages for high-volume ceramic component inspection. By leveraging our relationships, we will continue to develop leading solutions to provide our customers with significant competitive advantages to further their success."

About the Model 6680

ESI's Model 6680 Visual Test System provides automatic inspection and sorting of surface-mount MLCC, MLCI, and MLCV chips. Inspecting up to 2800 pts/min (168,000 pts/hr), the 6680 reduces labor cost and floor space for significant cost-of-ownership advantages in a compact platform. ESI's 6680 system provides the industry's best inspection capability of minor defects on terminated and un-terminated chips. While its software is enhanced with a broader set of individual defect categories, the new handling mechanism incorporates a belt conveyor to route chips to the "accept bin" without the possibility of damage. ESI's Model 6680 provides high throughput, precision and flexibility for high-volume production inspection of ceramic components.

####

About Electro Scientific Industries, Inc.
ESI is a pioneer and leading supplier of world-class photonic and laser systems that help its microelectronics customers achieve compelling yield and productivity gains. The company’s industry-leading, application-specific products enhance electronic-device performance in three key sectors — semiconductors, components and electronic interconnect — by enabling precision fine-tuning of device microfeatures in high-volume manufacturing environments. Founded in 1944, ESI is headquartered in Portland, Ore.

For more information, please click here

Contacts:
ESI
Brian Smith
503-672-5760

Copyright © Business Wire 2009

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Organometallics welcomes new editor-in-chief: Paul Chirik, Ph.D. July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Iran to Hold 3rd Int'l Forum on Nanotechnology Economy July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Chip Technology

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

NUS scientists use low cost technique to improve properties and functions of nanomaterials: By 'drawing' micropatterns on nanomaterials using a focused laser beam, scientists could modify properties of nanomaterials for effective applications in photonic and optoelectric applicat July 22nd, 2014

Dongbu HiTek Unveils Low-Voltage BCDMOS Process for Efficient Power Management in Smart Phones and Tablet Computers July 21st, 2014

Announcements

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

NIST shows ultrasonically propelled nanorods spin dizzyingly fast July 22nd, 2014

Penn Study: Understanding Graphene’s Electrical Properties on an Atomic Level July 22nd, 2014

Tools

EPFL Research on the use of AFM based nanoscale IR spectroscopy for the study of single amyloid molecules wins poster competition at Swiss Physics Society meeting July 22nd, 2014

The Hiden EQP Plasma Diagnostic with on-board MCA July 22nd, 2014

Nanometrics Announces Upcoming Investor Events July 22nd, 2014

Bruker Awarded Fourth PeakForce Tapping Patent: AFM Mode Uniquely Combines Highest Resolution Imaging and Material Property Mapping July 22nd, 2014

Photonics/Optics/Lasers

NUS scientists use low cost technique to improve properties and functions of nanomaterials: By 'drawing' micropatterns on nanomaterials using a focused laser beam, scientists could modify properties of nanomaterials for effective applications in photonic and optoelectric applicat July 22nd, 2014

Carbyne morphs when stretched: Rice University calculations show carbon-atom chain would go metal to semiconductor July 21st, 2014

Tiny laser sensor heightens bomb detection sensitivity July 19th, 2014

Future Electronics May Depend on Lasers, Not Quartz July 17th, 2014

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE