Nanotechnology Now - Press Release: FEI Introduces the Fibermetric System for Automated Measurement and Analysis of Micro- and Nano-Fibers

Home > Press > FEI Introduces the Fibermetric System for Automated Measurement and Analysis of Micro- and Nano-Fibers

Abstract:
The Fibermetric System Delivers Statistically Valid Data in Minutes to Improve Fiber and Filter Material Development and Manufacturing

FEI Introduces the Fibermetric System for Automated Measurement and Analysis of Micro- and Nano-Fibers

Hillsboro, OR | Posted on March 31st, 2009

FEI (Nasdaq: FEIC), a leading provider of electron imaging and analysis systems, today announced the Fibermetric™ system powered by the Phenom™ personal electron microscope. The Fibermetric system is designed to discover and quantify the properties of woven and nonwoven fiber samples in minutes, making direct observation and measurement of micro- and nano-fibers faster, more accurate and easier.

"This is the first integrated, turnkey system for sub-micron fiber imaging and automated measurement," said Paul Scagnetti, vice president and general manager, Industry Division of FEI. "Synthetic fiber manufacturers will typically forego the measurement of sub-micron fibers and pores, suffering the process control and product quality consequences, or they may use a more expensive and complex electron microscope in the lab, which can take several days before the data is available to those who need it."

With the Fibermetric system, engineers can get the data they need themselves. The system automatically collects hundreds of measurements per image, and generates fiber and pore size distribution plots for quality control and for predicting application properties such as filtration efficiency.

The Fibermetric system requires no laboratory infrastructure or specially trained personnel. It has a sample loading time of less than 30 seconds, and its automated measurement capability generates statistically valid data in the time it takes to load a conventional scanning electron microscope (SEM). Magnifications up to 24,000 times produce accurate information on fibers as small as 100nm in diameter.

The Fibermetric system accurately images and measures almost any fiber sample with its 4.9 nm/pixel resolution and a Gaussian fit function, which automatically finds and measures fibers and pores. Nano-fibers with diameters of 100nm are routinely measured with greater than 97 percent accuracy.

"The Fibermetric system is part of the FEI Phenom family of personal electron microscopes," said Scagnetti. "With its affordable price, ease-of-use, speed and accuracy, the Fibermetric system delivers a rapid return on investment and a sustainable competitive advantage."

The Fibermetric system is available now from Phenom sales agents and distributors. More information is available at www.phenom-world.com/fiber.

FEI Safe Harbor Statement

This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Fibermetric system and anticipated availability date. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and our ability to manufacture, ship and deliver the tools as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

FEI is a registered trademark, and the FEI logo, Fibermetric, and Phenom are trademarks of FEI Company.

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About FEI
FEI (Nasdaq: FEIC) is the world leader in pioneering technologies and applications that deliver imaging solutions for 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström level. With a 60-year legacy of technological innovation and leadership, FEI has set the performance standard across TEM, SEM and DualBeam categories with its Titan™, Magellan™ and Helios™ product families. FEI’s customers, working in advanced research and manufacturing, are supported by field-experienced applications specialists. They have open access to FEI’s prestigious global user network so they can succeed in accelerating nanoscale discovery. FEI’s NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has sales and service operations in more than 50 countries around the world.

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