Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


android tablet pc

Home > Press > Non-Destructive Hall Mobility Testing for Semiconductor, Solar offered by Lehighton Electronics’ New LEI 1605

Abstract:
Lehighton Electronics, Inc (LEI) announces the introduction of its new LEI 1605 Mobility Tester for semiconductor and solar manufacturing processes. The LEI 1605 manually measures electron mobility (EM) through a non-destructive contactless means on a variety of substrates and materials.

Non-Destructive Hall Mobility Testing for Semiconductor, Solar offered by Lehighton Electronics’ New LEI 1605

Lehighton, PA | Posted on February 27th, 2009

The LEI 1605 is ideal for process development, prototyping, low-volume and small batch production. It is the newest product in Lehighton's line of mobility equipment geared toward universities and R&D centers. Its manual operation and thus lower cost make it an attractive and practical research alternative to the automatic, more expensive solutions that LEI offers for production volumes.

The LEI 1605 replaces the destructive van der Pauw Hall and Parallelepiped or Bridge Type methods currently used to achieve electron mobility, carrier density, carrier concentration and sheet resistance measures. The LEI 1605 provides critical, accurate process control measurements in situ. With the LEI 1605, researchers can measure electron mobility after each epitaxial layer deposition, enhancing their ability to monitor specific stages of process control. The LEI 1605 with optional upgrades will measure electron mobility in the range of ~300-20,000 cm2/v.sec, and will measure sheet resistance from ~100Ω-3kΩ/square and possesses mapping capability.

The LEI 1605 reduces the cost of research by providing EM results instantly, allowing operators to make changes for optimal processing. The destructive Hall tests do not allow substrates to be recycled and reused; the LEI1605 eliminates this waste by allowing the reuse of wafers repeatedly. With this tool, there is no more cleaving, soldering and hoping for good connections and test results. This ultimately leads to more research of more concepts due to quick results, low risk factors, and low cost consumption. More research in shorter time with in-situ testing can lead to more projects and more funding.

####

About Lehighton Electronics, Inc
Lehighton Electronics Inc. has been engineering and providing metrology solutions to the silicon, compound semiconductor, solar, flat panel display and other related industries for more than 40 years. Some tools sold in the 1970s are still used in production today, providing our customers with consistently low tool ownership and operating costs.

For more information, please click here

Contacts:
Robert Warren
(800) 535-1112
Phone: 610-377-5990
Fax: 610-377-6820

Copyright © Lehighton Electronics, Inc

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Imaging electric charge propagating along microbial nanowires October 20th, 2014

Design of micro and nanoparticles to improve treatments for Alzheimers and Parkinsons: At the Faculty of Pharmacy of the UPV/EHU-University of the Basque Country encapsulation techniques are being developed to deliver correctly and effectively certain drugs October 20th, 2014

Physicists build reversible laser tractor beam October 20th, 2014

Removal of Limitations of Composites at Superheat Temperatures October 20th, 2014

Chip Technology

Crystallizing the DNA nanotechnology dream: Scientists have designed the first large DNA crystals with precisely prescribed depths and complex 3D features, which could create revolutionary nanodevices October 20th, 2014

Imaging electric charge propagating along microbial nanowires October 20th, 2014

Superconducting circuits, simplified: New circuit design could unlock the power of experimental superconducting computer chips October 18th, 2014

3DXNano™ ESD Carbon Nanotube 3D Printing Filament - optimized for demanding 3D printing applications in the semi-con and electronics industry October 16th, 2014

Announcements

Imaging electric charge propagating along microbial nanowires October 20th, 2014

Design of micro and nanoparticles to improve treatments for Alzheimers and Parkinsons: At the Faculty of Pharmacy of the UPV/EHU-University of the Basque Country encapsulation techniques are being developed to deliver correctly and effectively certain drugs October 20th, 2014

Physicists build reversible laser tractor beam October 20th, 2014

Removal of Limitations of Composites at Superheat Temperatures October 20th, 2014

Tools

New Grand ARM Transmission Electron Microscope Offers Highest Commercially-Available Atomic Resolution of 63 Picometers October 17th, 2014

Nanodevices for clinical diagnostic with potential for the international market: The development is based on optical principles and provides precision and allows saving vital time for the patient October 15th, 2014

Nanotronics Imaging Releases nSPEC® 3D, Powerful Microscope That Captures 3D Images at Nanoscale, in Lightning Speed: Company Unveils Design at American Chemical Society 2014 International Elastomer Conference October 14th, 2014

Unique catalysts for hydrogen fuel cells synthesized in ordinary kitchen microwave oven October 14th, 2014

NanoNews-Digest
The latest news from around the world, FREE





  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More














ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







© Copyright 1999-2014 7th Wave, Inc. All Rights Reserved PRIVACY POLICY :: CONTACT US :: STATS :: SITE MAP :: ADVERTISE