Nanotechnology Now

Our NanoNews Digest Sponsors

Heifer International

Wikipedia Affiliate Button

Home > Press > Argon Ion Column Extends ZEISS NVision Product Family

Carl Zeiss SMT adds third column to NVision 40 CrossBeam system for Argon supreme milling of TEM lamella.
Carl Zeiss SMT adds third column to NVision 40 CrossBeam system for Argon supreme milling of TEM lamella.

Abstract:
Supreme milling. Third column makes NVision 40 even more versatile.

Argon Ion Column Extends ZEISS NVision Product Family

ALBUQUERQUE, NM | Posted on August 4th, 2008

To enable the production of highly polished TEM lamellas, Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.

Highly polished TEM lamellas are a prerequisite for successful analysis of specimens in a transmission electron microscope. The new low-energy Argon ion column in the NVision 40 CrossBeam workstation allows the fabrication of supreme sample quality by enabling almost complete removal of surface damage that typically occurs during the initial FIB milling steps. With this "supreme milling" method, unprecedented TEM lamella quality is achieved enabling quantitative atomic resolution characterization of samples. By employing the new triple beam technology, time consuming and cost-intensive additional polishing processes in auxiliary tools become obsolete.

Two dedicated products

The new NVision 40 Argon will be available in two dedicated models:

* a process oriented, high-throughput version dedicated to routine TEM sample preparation for semiconductor customers;
* a multi purpose versatile version for the highest demands in processing and analytics applications in materials science and the semiconductor lab.

The Argon ion column is retrofittable to existing NVision 40 workstations.

NVision 40 Argon is a joint product of Carl Zeiss SMT Nano Technology System division and its Japanese partner SII Nano Technology.

####

About Carl Zeiss SMT
As the global leader in innovative lithography optics, as well as optical and particle-beam based inspection, analysis and measuring systems, Carl Zeiss SMT opens up new avenues for its customers in industrial manufacturing environments, quality assurance and industrial and academic R&D. Decades of market leadership are based on the success of its leading know-how in light, electron and ion-optical technologies. Together with its subsidiaries in Germany, England, France and the USA, the international group of companies has more than 2,400 employees. In fiscal year 2006/07, Carl Zeiss SMT AG generated revenues of over EUR 1 billion. Carl Zeiss SMT AG is a wholly owned subsidiary of Carl Zeiss AG.

For more information, please click here

Contacts:
Carl Zeiss SMT - Public Relations
Markus Wiederspahn
+49 73 64 20 21 94

Copyright © Business Wire 2008

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

A big leap toward tinier lines: Self-assembly technique could lead to long-awaited, simple method for making smaller microchip patterns March 27th, 2017

“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017

Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017

Laser activated gold pyramids could deliver drugs, DNA into cells without harm: Microstructures create temporary pores in cells March 27th, 2017

Announcements

A big leap toward tinier lines: Self-assembly technique could lead to long-awaited, simple method for making smaller microchip patterns March 27th, 2017

“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017

ATTOPSEMI Technology Joins FDXcelerator Program to Deliver Advanced Non-Volatile Memory IP to GLOBALFOUNDRIES 22 FDX® Technology Platform: Leading-edge I-fuse™ brings higher reliability, smaller cell size and ease of programmability for consumer, automotive, and IoT applications March 27th, 2017

Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017

Tools

“Cysteine Rose” Wins 2016 Thermo Fisher Scientific Electron Microscopy Image Contest: Thermo Fisher honors Andrea Jacassi of the Italian Institute of Technology for image of cysteine crystals using focused ion beam techniques March 27th, 2017

Leti and HORIBA Scientific to Host Webinar on Ultrafast Characterization Tool: Plasma Profiling Time-of-Flight Mass Spectrometer Tool Cuts Optimization Time In Layer Deposition and Fabrication of Wide Range of Applications March 27th, 2017

Researchers make flexible glass for tiny medical devices: Glass can bend over and over again on a nanoscale March 27th, 2017

Cryo-electron microscopy achieves unprecedented resolution using new computational methods March 25th, 2017

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project