Nanotechnology Now

Our NanoNews Digest Sponsors





Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Chipworks' New ICInside SurveyorTM - Putting a Virtual SEM on Your Desktop, Accelerating the Use of Reverse Engineering in Forward Designs

ICInsideSurveyor-MEMS
ICInsideSurveyor-MEMS

Abstract:
ICInside SurveyorTM Is the World's First Tool That Allows MEMS, Architects and IC Designers to Quickly Analyze Thousands of High Magnification Images on Their Desktop

Chipworks' New ICInside SurveyorTM - Putting a Virtual SEM on Your Desktop, Accelerating the Use of Reverse Engineering in Forward Designs

Ottawa, Canada | Posted on July 11th, 2008

Chipworks (www.chipworks.com), the leader in reverse engineering and technical analysis of semiconductors and microelectronic systems, today announced ICInsider Surveyor™, a powerful tool that delivers thousands of extremely high magnification design images directly from Chipworks' labs to design engineers' desktops. Chipworks will be demonstrating the ICInside Surveyor™ during select appointments at Semicon West in San Francisco, July 15 - 17.

"This new capability puts a virtual scanning electron microscope (SEM) on our clients' desktops, giving them the ability to measure, label, and study the layers of a fully imaged device at extremely high magnification," says Julia Elvidge, President of Chipworks. "Our clients benefit by being able to examine every single nanometer across all interconnect layers of the hottest new device, or the structural details of an innovative new MEMS chip."

Developed in tandem with our clients, the ICInside Surveyor™ significantly reduces the time required to analyze competitive devices and integrate that analysis into product designs, resulting in lower development costs, faster time-to-market and more socket wins.

The ICInside Surveyor™ dramatically speeds delivery of world class reverse engineering analysis that is timely and accurate, allowing design engineers to rapidly understand and realize value from reverse engineering in forward design. The innovative application is a robust way to explore competitive designs and identify areas for die shrinkage, circuit extraction, and layout organization (e.g. ESD structures). For MEMS Architects, it also provides "Infinite Measurability" for building accurate simulations.

ICInside Surveyor™ is now available with seven reports on MEMS devices including:

-- Analog Devices ADXL330 3-axis accelerometer
-- Bosch SMB380 3-axis accelerometer
-- Bosch SMG070 gyroscope
-- Freescale MMA7260Q 3-axis accelerometer
-- Kionix KXM52 3-axis accelerometer
-- SiTime SiT8002 oscillator
-- STMicroelectronics LIS302DL 3-axis accelerometer

Additional reports will be available on an ongoing basis, and clients can request a custom analysis at any time.

To learn more about the Chipworks ICInside Surveyor™, visit www.chipworks.com/icinsidesurveyor.aspx. To book a demonstration at Semicon West, please contact Rob Williamson at .

####

About Chipworks
Chipworks is the recognized leader in reverse engineering and patent infringement analysis of semiconductors and electronic systems. The company's ability to analyze the circuitry and physical composition of these systems makes them a key partner in the success of the world's largest semiconductor and microelectronics companies. These companies depend on Chipworks to secure, defend, and grow market share, and to save millions of dollars in royalty payments and product design costs, allowing them to earn millions by licensing patents, design superior products, and launch new products faster. Intellectual property groups and their legal counsel trust Chipworks for success in patent licensing and litigation. Research & Development and Product Management rely on Chipworks for success in new product design and launch. Headquartered in Ottawa, Canada, Chipworks maintains offices in Japan, Korea, Taiwan, Israel, and Poland.

For more information, please click here

Contacts:
Phyllis Grabot
805.341.7269

Copyright © Marketwire

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Chip Technology

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

Kwansei Gakuin University in Hyogo, Japan, uses Raman microscopy to study crystallographic defects in silicon carbide wafers August 25th, 2015

A little light interaction leaves quantum physicists beaming August 25th, 2015

'Magic' sphere for information transfer: Professor at the Lomonosov Moscow State University made the «magic» sphere for information transfer August 24th, 2015

Announcements

Small but heading for the big time: Nanobiotix half year results for the six months ended 30 June 2015, in line with expectations: Major clinical achievements and corporate developments August 28th, 2015

A new technique to make drugs more soluble August 28th, 2015

Nanocatalysts improve processes for the petrochemical industry August 28th, 2015

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Tools

Nanolab Technologies LEAPS Forward with High-Performance Analysis Services to the World: Nanolab Orders Advanced Local Electrode Atom Probe (LEAP®) Microscope from CAMECA Unit of AMETEK Materials Analysis Division August 27th, 2015

Nanometrics to Participate in the Citi 2015 Global Technology Conference August 26th, 2015

50 Years of Scanning Electron Microscopy from ZEISS: ZEISS celebrates the birth of the first commercial scanning electron microscope in 1965 August 26th, 2015

Announcing Oxford Instruments and School of Physics signing a Memorandum of Understanding August 26th, 2015

NanoNews-Digest
The latest news from around the world, FREE



  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project







Car Brands
Buy website traffic