Nanotechnology Now







Heifer International

Wikipedia Affiliate Button


DHgate

Home > Press > Nanometrics Achieves Milestone Shipment of 1,000th Integrated Metrology System

Abstract:
Integrated Metrology Systems Provide Film Analysis, OCD Measurement Options

Nanometrics Achieves Milestone Shipment of 1,000th Integrated Metrology System

MILPITAS, CA | Posted on February 19th, 2008

Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced metrology equipment to the semiconductor industry, today announced the 1,000th shipment of its Integrated Metrology® (IM) system, highlighting the company's leadership position in the IM market for semiconductor manufacturing. The milestone system was a Nanometrics 9010 SCRIBE unit integrated into an advanced plasma etch system used to control critical gate etch applications in advanced logic devices.

Nanometrics introduced its first IM system in 1998, an ultra-compact, real-time metrology system used in chemical mechanical polishing (CMP) thickness control applications. "Due to rapid customer acceptance and advancing process control requirements, Nanometrics' integrated metrology products evolved into a leading-edge tool set specializing in CMP, CVD, etch, and photolithography process control applications," said Steve Bradley, Nanometrics' director of Integrated Metrology Business. "Our customers see substantial improvements in process control capability and end of line product yield as a benefit of integrated metrology adoption. Reaching this milestone in such a short time reflects the industry's ongoing acceptance of integrated metrology and Nanometrics' commitment to innovative process control solutions."

Nanometrics 9000 Series IM systems provide 300 mm thin film and optical critical dimension (OCD) metrology solutions for all critical semiconductor processing applications. The 9000 Series incorporate state-of-the-art motion-control, optics, and modeling software, enabling comprehensive control over critical processes, including measurement of complex film stacks as well as 2D and 3D modeling of advanced structures.

####

About Nanometrics Incorporated
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used in semiconductor manufacturing. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control and optical, electrical and material properties, including the structural composition of silicon and compound semiconductor devices, during various steps of the manufacturing process. These systems enable semiconductor manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on the NASDAQ Global Market under the symbol NANO.

For more information, please click here

Contacts:
Public Relations:
Vincent Mayeda
Loomis Group
909.590.9324 tel


Company Contact:
Kevin Heidrich
Nanometrics
408-545-6000 tel

Copyright © Nanometrics Incorporated

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

The next step in DNA computing: GPS mapping? May 6th, 2015

Improving Clinical Care and Patient Quality of Life in Advanced Liver Disease, d-LIVER Workshop, Milan, 27 May 2015 May 6th, 2015

Grafoid Acquires MuAnalysis Inc; Expands Its Advanced Materials Testing Capabilities May 6th, 2015

Winner Announced for NNI’s First ‘EnvisioNano’ Nanotechnology Image Contest May 6th, 2015

Chip Technology

The next step in DNA computing: GPS mapping? May 6th, 2015

Improving organic transistors that drive flexible and conformable electronics: UMass Amherst scientists advance understanding of strain effects on performance May 5th, 2015

New chip architecture may provide foundation for quantum computer: Researchers at the Georgia Tech Research Institute have developed a microfabricated ion trap architecture that holds promise for increasing the density of qubits in future quantum computers May 5th, 2015

Silicon Storage Technology and GLOBALFOUNDRIES Announce Qualification of Automotive Grade 55nm Embedded Flash Memory Technology May 5th, 2015

Announcements

The next step in DNA computing: GPS mapping? May 6th, 2015

Improving Clinical Care and Patient Quality of Life in Advanced Liver Disease, d-LIVER Workshop, Milan, 27 May 2015 May 6th, 2015

Grafoid Acquires MuAnalysis Inc; Expands Its Advanced Materials Testing Capabilities May 6th, 2015

Winner Announced for NNI’s First ‘EnvisioNano’ Nanotechnology Image Contest May 6th, 2015

Tools

Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015 May 5th, 2015

Iranian Scientists Present Model to Study Mechanical Vibrations of Structures Containing Nanocomposites May 5th, 2015

Nanometrics to Present at the B. Riley & Co. 16th Annual Investor Conference May 2nd, 2015

Time Dependant Spectroscopy of Microscopic Samples: CRAIC TimePro™ software is used with CRAIC Technologies microspectrometers to measure the kinetic UV-visible-NIR, Raman and fluorescence spectra of microscopic sample areas May 2nd, 2015

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoTech-Transfer
University Technology Transfer & Patents
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More










ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project